Properties of exchange biased Co/Co3O4 bilayer films
Co/Co3O4 bilayer films were fabricated by RF sputtering with Co and Co3O4 targets. Exchange bias effect in the bilayer films was observed at 80K by vibrating sample magnetometer. The bias effect disappeared about 240K slightly lower than the Neel point of CoO and much higher than the Neel temperatur...
Gespeichert in:
Veröffentlicht in: | Journal of alloys and compounds 2008-02, Vol.450 (1-2), p.128-130 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Co/Co3O4 bilayer films were fabricated by RF sputtering with Co and Co3O4 targets. Exchange bias effect in the bilayer films was observed at 80K by vibrating sample magnetometer. The bias effect disappeared about 240K slightly lower than the Neel point of CoO and much higher than the Neel temperature of Co3O4 about 40K. To clarify the origin of the exchange bias effect, Auger and X-ray photoelectron spectroscopy were employed and CoO was found at a transition region from Co3O4 layer to Co layer due to oxygen diffusion during sputtering. The angular dependence of exchange bias field HE was obtained to obey function of HE(theta)=18.06(kA/m)[-costheta+0.22cos3theta+0.03cos5theta-0.01cos7theta+]. |
---|---|
ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2007.05.030 |