Noise and switching phenomena in thick-film resistors

Low frequency noise spectroscopy is employed to examine fluctuating phenomena that take place in the material of resistive films and in the film/termination interface of a thick-film resistor. It has been found that the excess low frequency noise apart from the 1/f component contains contributions f...

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Veröffentlicht in:	Journal of physics. D, Applied physics Applied physics, 2008-01, Vol.41 (2), p.025303-025303 (12)
Hauptverfasser:	Kolek, A, Stadler, A W, Zawiślak, Z, Mleczko, K, Dziedzic, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology Interfaces Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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