Growth and structure of thin MnO films on Ag(0 0 1) in dependence on film thickness

We have investigated the structure of thin MnO films grown on a single-crystal Ag(0 0 1) surface in dependence on layer thickness by combination of low energy electron diffraction (LEED) and X-ray photoelectron diffraction (XPD) methods. The analysis of LEED profiles shows that the in-plane lattice...

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Veröffentlicht in:	Surface science 2008-01, Vol.602 (2), p.597-606
Hauptverfasser:	Chassé, A., Langheinrich, Ch, Müller, F., Hüfner, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electron solid scattering and diffraction Exact sciences and technology Low energy electron diffraction MnO thin film Multiple scattering calculations Photoelectron diffraction measurement Physics Single-crystal epitaxy Surface structure and morphology Transition metal-oxides
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