The impact of NBTI on the performance of combinational and sequential circuits

Negative-bias-temperature-instability (NBTI) has become the primary limiting factor of circuit lifetime. In this work, we develop a general framework for analyzing the impact of NBTI on the performance of a circuit, based on various circuit parameters such as the supply voltage, temperature, and nod...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Wang, Wenping, Yang, Shengqi, Bhardwaj, Sarvesh, Vattikonda, Rakesh, Vrudhula, Sarma, Liu, Frank, Cao, Yu
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit optimization Degradation Design duty cycle Experimentation Hardware > Electronic design automation > Physical design (EDA) Hardware > Hardware test Hardware > Hardware validation Hardware > Robustness input pattern NBTI Niobium compounds Performance analysis performance degradation Reliability Sequential circuits Signal analysis speed supply voltage Switching circuits Temperature Titanium compounds Voltage
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!