Optical and electrical properties of ZnO/NiO heterojunctions obtained by the spray-pyrolysis method
In this work, the effect of thermal annealing on the phase composition, surface morphology, and structural, substructural, optical, and electrical properties of multilayer structures based on p -NiO/ n -ZnO heterojunctions obtained by spraying molecular solutions (spray-pyrolysis) is determined. Aft...
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| Veröffentlicht in: | Journal of materials science 2024-09, Vol.59 (33), p.15738-15751 |
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| container_title | Journal of materials science |
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| creator | Yermakov, Maksym Pshenychnyi, Roman Opanasyuk, Anatoliy Klymov, Oleksii Muñoz-Sanjosé, Vicente |
| description | In this work, the effect of thermal annealing on the phase composition, surface morphology, and structural, substructural, optical, and electrical properties of multilayer structures based on
p
-NiO/
n
-ZnO heterojunctions obtained by spraying molecular solutions (spray-pyrolysis) is determined. After deposition, the samples were annealed in vacuum at temperatures of 300, 400, 500 °C during 60 min. The multilayer structure was studied using X-ray diffraction analysis, scanning electron microscopy, Hall effect, and optical spectroscopy. The dark current–voltage characteristics of the heterojunctions were also measured. These studies made it possible to determine the main structural, morphological, electrical, and optical properties of the films, such as crystal lattice parameters, dimensions of the coherent scattering regions, microdeformation level, density of dislocations, and band gap width depending on the annealing temperature. The energy band diagram of heterojunctions was constructed from the Anderson and Van Ruyven models. |
| doi_str_mv | 10.1007/s10853-024-10110-y |
| format | Article |
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p
-NiO/
n
-ZnO heterojunctions obtained by spraying molecular solutions (spray-pyrolysis) is determined. After deposition, the samples were annealed in vacuum at temperatures of 300, 400, 500 °C during 60 min. The multilayer structure was studied using X-ray diffraction analysis, scanning electron microscopy, Hall effect, and optical spectroscopy. The dark current–voltage characteristics of the heterojunctions were also measured. These studies made it possible to determine the main structural, morphological, electrical, and optical properties of the films, such as crystal lattice parameters, dimensions of the coherent scattering regions, microdeformation level, density of dislocations, and band gap width depending on the annealing temperature. The energy band diagram of heterojunctions was constructed from the Anderson and Van Ruyven models.</description><identifier>ISSN: 0022-2461</identifier><identifier>EISSN: 1573-4803</identifier><identifier>DOI: 10.1007/s10853-024-10110-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Annealing ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Classical Mechanics ; Coherent scattering ; Composition effects ; Crystal dislocations ; Crystal lattices ; Crystallography and Scattering Methods ; Current voltage characteristics ; Dark current ; Deformation ; Dislocation density ; Electrical properties ; electron microscopy ; Electronic Materials ; energy ; Energy bands ; Energy gap ; Glass substrates ; Hall effect ; Heterojunctions ; Indium ; Lattice parameters ; Materials Science ; Methods ; Morphology ; Multilayers ; nickel oxide ; Nickel oxides ; Optical properties ; Phase composition ; Point defects ; Polymer Sciences ; Pyrolysis ; Radiation ; Solid Mechanics ; spectroscopy ; Spraying ; Temperature ; X-ray diffraction ; Zinc oxide ; Zinc oxides</subject><ispartof>Journal of materials science, 2024-09, Vol.59 (33), p.15738-15751</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c233t-e97fac95b9b38faeff28aa4d27b55c025aa91512f0d0026694fa0e26271303113</cites><orcidid>0000-0003-1170-6415</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10853-024-10110-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10853-024-10110-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,777,781,27905,27906,41469,42538,51300</link.rule.ids></links><search><creatorcontrib>Yermakov, Maksym</creatorcontrib><creatorcontrib>Pshenychnyi, Roman</creatorcontrib><creatorcontrib>Opanasyuk, Anatoliy</creatorcontrib><creatorcontrib>Klymov, Oleksii</creatorcontrib><creatorcontrib>Muñoz-Sanjosé, Vicente</creatorcontrib><title>Optical and electrical properties of ZnO/NiO heterojunctions obtained by the spray-pyrolysis method</title><title>Journal of materials science</title><addtitle>J Mater Sci</addtitle><description>In this work, the effect of thermal annealing on the phase composition, surface morphology, and structural, substructural, optical, and electrical properties of multilayer structures based on
p
-NiO/
n
-ZnO heterojunctions obtained by spraying molecular solutions (spray-pyrolysis) is determined. After deposition, the samples were annealed in vacuum at temperatures of 300, 400, 500 °C during 60 min. The multilayer structure was studied using X-ray diffraction analysis, scanning electron microscopy, Hall effect, and optical spectroscopy. The dark current–voltage characteristics of the heterojunctions were also measured. These studies made it possible to determine the main structural, morphological, electrical, and optical properties of the films, such as crystal lattice parameters, dimensions of the coherent scattering regions, microdeformation level, density of dislocations, and band gap width depending on the annealing temperature. The energy band diagram of heterojunctions was constructed from the Anderson and Van Ruyven models.</description><subject>Annealing</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Classical Mechanics</subject><subject>Coherent scattering</subject><subject>Composition effects</subject><subject>Crystal dislocations</subject><subject>Crystal lattices</subject><subject>Crystallography and Scattering Methods</subject><subject>Current voltage characteristics</subject><subject>Dark current</subject><subject>Deformation</subject><subject>Dislocation density</subject><subject>Electrical properties</subject><subject>electron microscopy</subject><subject>Electronic Materials</subject><subject>energy</subject><subject>Energy bands</subject><subject>Energy gap</subject><subject>Glass substrates</subject><subject>Hall effect</subject><subject>Heterojunctions</subject><subject>Indium</subject><subject>Lattice parameters</subject><subject>Materials Science</subject><subject>Methods</subject><subject>Morphology</subject><subject>Multilayers</subject><subject>nickel oxide</subject><subject>Nickel oxides</subject><subject>Optical properties</subject><subject>Phase composition</subject><subject>Point defects</subject><subject>Polymer Sciences</subject><subject>Pyrolysis</subject><subject>Radiation</subject><subject>Solid Mechanics</subject><subject>spectroscopy</subject><subject>Spraying</subject><subject>Temperature</subject><subject>X-ray diffraction</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><issn>0022-2461</issn><issn>1573-4803</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kE1rGzEQhkVJoI7TP9CToJdcFI-k1X4ci8lHwdSX9tKL0GpHtcx6tZXkw_77qHEg0ENPwzDPO8w8hHzmcM8Bmk3i0CrJQFSMA-fAlg9kxVUjWdWCvCIrACGYqGr-kdykdAQA1Qi-InY_Z2_NSM00UBzR5vjazjHMGLPHRIOjv6b95rvf0wNmjOF4nmz2YSqjPhs_4UD7heYD0jRHs7B5iWFckk_0hPkQhlty7cyY8NNbXZOfjw8_ts9st3_6tv26Y1ZImRl2jTO2U33Xy9YZdE60xlSDaHqlLAhlTMcVFw6G8k1dd5UzgKIWDZcgOZdrcnfZW47_c8aU9ckni-NoJgznpCVXsqm7RrUF_fIPegznOJXrCgUgKyWEKpS4UDaGlCI6PUd_MnHRHPRf7_riXRfv-tW7XkpIXkJFhp9-Y3xf_Z_UCxb-hoM</recordid><startdate>20240901</startdate><enddate>20240901</enddate><creator>Yermakov, Maksym</creator><creator>Pshenychnyi, Roman</creator><creator>Opanasyuk, Anatoliy</creator><creator>Klymov, Oleksii</creator><creator>Muñoz-Sanjosé, Vicente</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7S9</scope><scope>L.6</scope><orcidid>https://orcid.org/0000-0003-1170-6415</orcidid></search><sort><creationdate>20240901</creationdate><title>Optical and electrical properties of ZnO/NiO heterojunctions obtained by the spray-pyrolysis method</title><author>Yermakov, Maksym ; Pshenychnyi, Roman ; Opanasyuk, Anatoliy ; Klymov, Oleksii ; Muñoz-Sanjosé, Vicente</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c233t-e97fac95b9b38faeff28aa4d27b55c025aa91512f0d0026694fa0e26271303113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Annealing</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Classical Mechanics</topic><topic>Coherent scattering</topic><topic>Composition effects</topic><topic>Crystal dislocations</topic><topic>Crystal lattices</topic><topic>Crystallography and Scattering Methods</topic><topic>Current voltage characteristics</topic><topic>Dark current</topic><topic>Deformation</topic><topic>Dislocation density</topic><topic>Electrical properties</topic><topic>electron microscopy</topic><topic>Electronic Materials</topic><topic>energy</topic><topic>Energy bands</topic><topic>Energy gap</topic><topic>Glass substrates</topic><topic>Hall effect</topic><topic>Heterojunctions</topic><topic>Indium</topic><topic>Lattice parameters</topic><topic>Materials Science</topic><topic>Methods</topic><topic>Morphology</topic><topic>Multilayers</topic><topic>nickel oxide</topic><topic>Nickel oxides</topic><topic>Optical properties</topic><topic>Phase composition</topic><topic>Point defects</topic><topic>Polymer Sciences</topic><topic>Pyrolysis</topic><topic>Radiation</topic><topic>Solid Mechanics</topic><topic>spectroscopy</topic><topic>Spraying</topic><topic>Temperature</topic><topic>X-ray diffraction</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yermakov, Maksym</creatorcontrib><creatorcontrib>Pshenychnyi, Roman</creatorcontrib><creatorcontrib>Opanasyuk, Anatoliy</creatorcontrib><creatorcontrib>Klymov, Oleksii</creatorcontrib><creatorcontrib>Muñoz-Sanjosé, Vicente</creatorcontrib><collection>CrossRef</collection><collection>AGRICOLA</collection><collection>AGRICOLA - Academic</collection><jtitle>Journal of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yermakov, Maksym</au><au>Pshenychnyi, Roman</au><au>Opanasyuk, Anatoliy</au><au>Klymov, Oleksii</au><au>Muñoz-Sanjosé, Vicente</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical and electrical properties of ZnO/NiO heterojunctions obtained by the spray-pyrolysis method</atitle><jtitle>Journal of materials science</jtitle><stitle>J Mater Sci</stitle><date>2024-09-01</date><risdate>2024</risdate><volume>59</volume><issue>33</issue><spage>15738</spage><epage>15751</epage><pages>15738-15751</pages><issn>0022-2461</issn><eissn>1573-4803</eissn><abstract>In this work, the effect of thermal annealing on the phase composition, surface morphology, and structural, substructural, optical, and electrical properties of multilayer structures based on
p
-NiO/
n
-ZnO heterojunctions obtained by spraying molecular solutions (spray-pyrolysis) is determined. After deposition, the samples were annealed in vacuum at temperatures of 300, 400, 500 °C during 60 min. The multilayer structure was studied using X-ray diffraction analysis, scanning electron microscopy, Hall effect, and optical spectroscopy. The dark current–voltage characteristics of the heterojunctions were also measured. These studies made it possible to determine the main structural, morphological, electrical, and optical properties of the films, such as crystal lattice parameters, dimensions of the coherent scattering regions, microdeformation level, density of dislocations, and band gap width depending on the annealing temperature. The energy band diagram of heterojunctions was constructed from the Anderson and Van Ruyven models.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10853-024-10110-y</doi><tpages>14</tpages><orcidid>https://orcid.org/0000-0003-1170-6415</orcidid></addata></record> |
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| subjects | Annealing Characterization and Evaluation of Materials Chemistry and Materials Science Classical Mechanics Coherent scattering Composition effects Crystal dislocations Crystal lattices Crystallography and Scattering Methods Current voltage characteristics Dark current Deformation Dislocation density Electrical properties electron microscopy Electronic Materials energy Energy bands Energy gap Glass substrates Hall effect Heterojunctions Indium Lattice parameters Materials Science Methods Morphology Multilayers nickel oxide Nickel oxides Optical properties Phase composition Point defects Polymer Sciences Pyrolysis Radiation Solid Mechanics spectroscopy Spraying Temperature X-ray diffraction Zinc oxide Zinc oxides |
| title | Optical and electrical properties of ZnO/NiO heterojunctions obtained by the spray-pyrolysis method |
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