Artefacts and diagnostic pitfalls in contrast-enhanced mammography: a pictorial review
Contrast-enhanced mammography (CEM) is an advanced emerging imaging technique that uses iodine contrast medium to improve breast cancer detection. Understanding CEM artefacts and pitfalls is important to prevent diagnostic misinterpretation. This article aims to provide a comprehensive review of the...
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| Veröffentlicht in: | Clinical radiology 2025-02, Vol.81, p.106763, Article 106763 |
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| container_title | Clinical radiology |
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| creator | Wong, Y.T. Yang, S. Leong, P.W. Chow, D.L.Y. Kwok, K.Y. Lau, K.Y.K. Li, O.C.A. |
| description | Contrast-enhanced mammography (CEM) is an advanced emerging imaging technique that uses iodine contrast medium to improve breast cancer detection. Understanding CEM artefacts and pitfalls is important to prevent diagnostic misinterpretation. This article aims to provide a comprehensive review of the artefacts and potential diagnostic pitfalls encountered in CEM, focusing on their characteristic imaging features and strategies to mitigate these issues. |
| doi_str_mv | 10.1016/j.crad.2024.106763 |
| format | Article |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| title | Artefacts and diagnostic pitfalls in contrast-enhanced mammography: a pictorial review |
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