Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices

Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic transfer matrices (PTMs). In particular, we apply them to evaluate circuit reliability in the presence of s...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atmospheric modeling Circuit analysis Computer architecture Data mining Hardware > Hardware test Hardware > Hardware validation > Functional verification Hardware > Robustness Hardware > Very large scale integration design Logic circuits Mathematics of computing > Mathematical analysis > Numerical analysis > Computations on matrices Neutrons Observability Power system reliability Probability Tensile stress
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!