Cross-domain zero-shot learning for enhanced fault diagnosis in high-voltage circuit breakers

•Introduces a novel zero-shot learning approach for HVCB diagnostics.•Develops automatic semantic construction for fault identification.•Ensures reliable fault detection across different domains. Ensuring the stability of high-voltage circuit breakers (HVCBs) is crucial for maintaining an uninterrup...

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Veröffentlicht in:Neural networks 2024-12, Vol.180, p.106681, Article 106681
Hauptverfasser: Yang, Qiuyu, Liao, Yuxiang, Li, Jianxing, Xie, Jingyi, Ruan, Jiangjun
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Sprache:eng
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Zusammenfassung:•Introduces a novel zero-shot learning approach for HVCB diagnostics.•Develops automatic semantic construction for fault identification.•Ensures reliable fault detection across different domains. Ensuring the stability of high-voltage circuit breakers (HVCBs) is crucial for maintaining an uninterrupted supply of electricity. Existing fault diagnosis methods typically rely on extensive labeled datasets, which are challenging to obtain due to the unique operational contexts and complex mechanical structures of HVCBs. Additionally, these methods often cater to specific HVCB models and lack generalizability across different types, limiting their practical applicability. To address these challenges, we propose a novel cross-domain zero-shot learning (CDZSL) approach specifically designed for HVCB fault diagnosis. This approach incorporates an adaptive weighted fusion strategy that combines vibration and current signals. To bypass the constraints of manual fault semantics, we develop an automatic semantic construction method. Furthermore, a multi-channel residual convolutional neural network is engineered to distill deep, low-level features, ensuring robust cross-domain diagnostic capabilities. Our model is further enhanced with a local subspace embedding technique that effectively aligns semantic features within the embedding space. Comprehensive experimental evaluations demonstrate the superior performance of our CDZSL approach in diagnosing faults across various HVCB types.
ISSN:0893-6080
1879-2782
1879-2782
DOI:10.1016/j.neunet.2024.106681