Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode
Figure. Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode. [Display omitted] •The integrated defects are constructed in Li-rich cathodes by Na2SnO3 modification.•The modification improves the cycling stability and...
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Veröffentlicht in: | Journal of colloid and interface science 2025-01, Vol.677 (Pt B), p.377-386 |
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creator | Zhang, Zhigui Kou, Pengzu Chen, Yu Zheng, Runguo Wang, Zhiyuan Sun, Hongyu Liu, Yanguo Wang, Dan |
description | Figure. Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode.
[Display omitted]
•The integrated defects are constructed in Li-rich cathodes by Na2SnO3 modification.•The modification improves the cycling stability and suppresses the voltage decay.•The mechanism of enhanced performance by Na2SnO3 modification is revealed.
Li-rich manganese-based oxide (LRMO) is considered one of the most promising cathode materials for next-generation lithium-ion batteries due to its high energy density. However, many issues need to be addressed before its large-scale commercialization, including significant voltage decay and capacity fading. Herein, a Sn4+/Na+ co-doping induced integrated defect structure (oxygen vacancies, stacking faults, and surface spinel phase) strategy is proposed to suppress the voltage decay and enhance the cycling performance of LRMO. The integrated surface defect structures have significantly favorable effects on the LRMO, where the oxygen vacancies remove surface labile oxygen and suppress surface oxygen release, the induced stacking faults alleviate the stress accumulation during cycling, the surface spinel phase promotes the Li+ diffusion and prevents the outward migration of cations, and the co-doped Sn4+/Na+ stabilize the layered structure. As a result, the modified sample Na2SnO3-1 % (NSO-1) achieves excellent cycling performance (capacity of 207 mAh/g and capacity retention of 96.71 % after 100 cycles at 0.5C) and a smaller voltage decay (less than 1.5 mV per cycle) compared with the unmodified LRMO. This work provides a new valuable strategy to suppress capacity fading and voltage decay of LRMO through dual-element substitution induced surface defect engineering. |
doi_str_mv | 10.1016/j.jcis.2024.08.078 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_3094045083</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0021979724018605</els_id><sourcerecordid>3153812837</sourcerecordid><originalsourceid>FETCH-LOGICAL-c270t-5925b5d89f6e7420eb6ff02655dd575b789356c3dcfaf4df1d4a90f558c072183</originalsourceid><addsrcrecordid>eNqFkb2O1DAUhS0EYoeFF6BALmkyXDtxbEs0aPnZlQbRQG059vWsR5kk2M5K8wS8Nh7NQgnVucV3TnE_Ql4z2DJg_bvD9uBi3nLg3RbUFqR6QjYMtGgkg_Yp2QBw1mip5RV5kfMBgDEh9HNy1WomWt6xDfn1cbVjgyMecSo0r0MusawlzhONk18d-poF98mWenoM6CpW0urKmpCWuXaWJWHO9GEei91jhZw9UTt56uxiXSwnGqyP057Oge5ik6K7p1-nZrAZz0y5nz2-JM-CHTO-esxr8uPzp-83t83u25e7mw-7xnEJpRGai0F4pUOPsuOAQx8C8F4I74UUg1S6Fb1rvQs2dD4w31kNQQjlQHKm2mvy9rK7pPnnirmYY8wOx9FOOK_ZtPUxinHVyv-joDvoBKi2ovyCujTnnDCYJcWjTSfDwJxdmYM5uzJnVwaUqa5q6c3j_joc0f-t_JFTgfcXAOtDHiImk13EqTqJqWowfo7_2v8N_6GnPQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3094045083</pqid></control><display><type>article</type><title>Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode</title><source>Elsevier ScienceDirect Journals</source><creator>Zhang, Zhigui ; Kou, Pengzu ; Chen, Yu ; Zheng, Runguo ; Wang, Zhiyuan ; Sun, Hongyu ; Liu, Yanguo ; Wang, Dan</creator><creatorcontrib>Zhang, Zhigui ; Kou, Pengzu ; Chen, Yu ; Zheng, Runguo ; Wang, Zhiyuan ; Sun, Hongyu ; Liu, Yanguo ; Wang, Dan</creatorcontrib><description>Figure. Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode.
[Display omitted]
•The integrated defects are constructed in Li-rich cathodes by Na2SnO3 modification.•The modification improves the cycling stability and suppresses the voltage decay.•The mechanism of enhanced performance by Na2SnO3 modification is revealed.
Li-rich manganese-based oxide (LRMO) is considered one of the most promising cathode materials for next-generation lithium-ion batteries due to its high energy density. However, many issues need to be addressed before its large-scale commercialization, including significant voltage decay and capacity fading. Herein, a Sn4+/Na+ co-doping induced integrated defect structure (oxygen vacancies, stacking faults, and surface spinel phase) strategy is proposed to suppress the voltage decay and enhance the cycling performance of LRMO. The integrated surface defect structures have significantly favorable effects on the LRMO, where the oxygen vacancies remove surface labile oxygen and suppress surface oxygen release, the induced stacking faults alleviate the stress accumulation during cycling, the surface spinel phase promotes the Li+ diffusion and prevents the outward migration of cations, and the co-doped Sn4+/Na+ stabilize the layered structure. As a result, the modified sample Na2SnO3-1 % (NSO-1) achieves excellent cycling performance (capacity of 207 mAh/g and capacity retention of 96.71 % after 100 cycles at 0.5C) and a smaller voltage decay (less than 1.5 mV per cycle) compared with the unmodified LRMO. This work provides a new valuable strategy to suppress capacity fading and voltage decay of LRMO through dual-element substitution induced surface defect engineering.</description><identifier>ISSN: 0021-9797</identifier><identifier>ISSN: 1095-7103</identifier><identifier>EISSN: 1095-7103</identifier><identifier>DOI: 10.1016/j.jcis.2024.08.078</identifier><identifier>PMID: 39153241</identifier><language>eng</language><publisher>United States: Elsevier Inc</publisher><subject>Capacity fading ; cathodes ; commercialization ; electric potential difference ; energy density ; Integrated defect ; Li-rich manganese-based oxide ; oxygen ; Voltage decay</subject><ispartof>Journal of colloid and interface science, 2025-01, Vol.677 (Pt B), p.377-386</ispartof><rights>2024 Elsevier Inc.</rights><rights>Copyright © 2024 Elsevier Inc. All rights reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-5925b5d89f6e7420eb6ff02655dd575b789356c3dcfaf4df1d4a90f558c072183</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jcis.2024.08.078$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,27905,27906,45976</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/39153241$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Zhang, Zhigui</creatorcontrib><creatorcontrib>Kou, Pengzu</creatorcontrib><creatorcontrib>Chen, Yu</creatorcontrib><creatorcontrib>Zheng, Runguo</creatorcontrib><creatorcontrib>Wang, Zhiyuan</creatorcontrib><creatorcontrib>Sun, Hongyu</creatorcontrib><creatorcontrib>Liu, Yanguo</creatorcontrib><creatorcontrib>Wang, Dan</creatorcontrib><title>Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode</title><title>Journal of colloid and interface science</title><addtitle>J Colloid Interface Sci</addtitle><description>Figure. Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode.
[Display omitted]
•The integrated defects are constructed in Li-rich cathodes by Na2SnO3 modification.•The modification improves the cycling stability and suppresses the voltage decay.•The mechanism of enhanced performance by Na2SnO3 modification is revealed.
Li-rich manganese-based oxide (LRMO) is considered one of the most promising cathode materials for next-generation lithium-ion batteries due to its high energy density. However, many issues need to be addressed before its large-scale commercialization, including significant voltage decay and capacity fading. Herein, a Sn4+/Na+ co-doping induced integrated defect structure (oxygen vacancies, stacking faults, and surface spinel phase) strategy is proposed to suppress the voltage decay and enhance the cycling performance of LRMO. The integrated surface defect structures have significantly favorable effects on the LRMO, where the oxygen vacancies remove surface labile oxygen and suppress surface oxygen release, the induced stacking faults alleviate the stress accumulation during cycling, the surface spinel phase promotes the Li+ diffusion and prevents the outward migration of cations, and the co-doped Sn4+/Na+ stabilize the layered structure. As a result, the modified sample Na2SnO3-1 % (NSO-1) achieves excellent cycling performance (capacity of 207 mAh/g and capacity retention of 96.71 % after 100 cycles at 0.5C) and a smaller voltage decay (less than 1.5 mV per cycle) compared with the unmodified LRMO. This work provides a new valuable strategy to suppress capacity fading and voltage decay of LRMO through dual-element substitution induced surface defect engineering.</description><subject>Capacity fading</subject><subject>cathodes</subject><subject>commercialization</subject><subject>electric potential difference</subject><subject>energy density</subject><subject>Integrated defect</subject><subject>Li-rich manganese-based oxide</subject><subject>oxygen</subject><subject>Voltage decay</subject><issn>0021-9797</issn><issn>1095-7103</issn><issn>1095-7103</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2025</creationdate><recordtype>article</recordtype><recordid>eNqFkb2O1DAUhS0EYoeFF6BALmkyXDtxbEs0aPnZlQbRQG059vWsR5kk2M5K8wS8Nh7NQgnVucV3TnE_Ql4z2DJg_bvD9uBi3nLg3RbUFqR6QjYMtGgkg_Yp2QBw1mip5RV5kfMBgDEh9HNy1WomWt6xDfn1cbVjgyMecSo0r0MusawlzhONk18d-poF98mWenoM6CpW0urKmpCWuXaWJWHO9GEei91jhZw9UTt56uxiXSwnGqyP057Oge5ik6K7p1-nZrAZz0y5nz2-JM-CHTO-esxr8uPzp-83t83u25e7mw-7xnEJpRGai0F4pUOPsuOAQx8C8F4I74UUg1S6Fb1rvQs2dD4w31kNQQjlQHKm2mvy9rK7pPnnirmYY8wOx9FOOK_ZtPUxinHVyv-joDvoBKi2ovyCujTnnDCYJcWjTSfDwJxdmYM5uzJnVwaUqa5q6c3j_joc0f-t_JFTgfcXAOtDHiImk13EqTqJqWowfo7_2v8N_6GnPQ</recordid><startdate>20250101</startdate><enddate>20250101</enddate><creator>Zhang, Zhigui</creator><creator>Kou, Pengzu</creator><creator>Chen, Yu</creator><creator>Zheng, Runguo</creator><creator>Wang, Zhiyuan</creator><creator>Sun, Hongyu</creator><creator>Liu, Yanguo</creator><creator>Wang, Dan</creator><general>Elsevier Inc</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7S9</scope><scope>L.6</scope></search><sort><creationdate>20250101</creationdate><title>Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode</title><author>Zhang, Zhigui ; Kou, Pengzu ; Chen, Yu ; Zheng, Runguo ; Wang, Zhiyuan ; Sun, Hongyu ; Liu, Yanguo ; Wang, Dan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-5925b5d89f6e7420eb6ff02655dd575b789356c3dcfaf4df1d4a90f558c072183</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2025</creationdate><topic>Capacity fading</topic><topic>cathodes</topic><topic>commercialization</topic><topic>electric potential difference</topic><topic>energy density</topic><topic>Integrated defect</topic><topic>Li-rich manganese-based oxide</topic><topic>oxygen</topic><topic>Voltage decay</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Zhigui</creatorcontrib><creatorcontrib>Kou, Pengzu</creatorcontrib><creatorcontrib>Chen, Yu</creatorcontrib><creatorcontrib>Zheng, Runguo</creatorcontrib><creatorcontrib>Wang, Zhiyuan</creatorcontrib><creatorcontrib>Sun, Hongyu</creatorcontrib><creatorcontrib>Liu, Yanguo</creatorcontrib><creatorcontrib>Wang, Dan</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>AGRICOLA</collection><collection>AGRICOLA - Academic</collection><jtitle>Journal of colloid and interface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Zhigui</au><au>Kou, Pengzu</au><au>Chen, Yu</au><au>Zheng, Runguo</au><au>Wang, Zhiyuan</au><au>Sun, Hongyu</au><au>Liu, Yanguo</au><au>Wang, Dan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode</atitle><jtitle>Journal of colloid and interface science</jtitle><addtitle>J Colloid Interface Sci</addtitle><date>2025-01-01</date><risdate>2025</risdate><volume>677</volume><issue>Pt B</issue><spage>377</spage><epage>386</epage><pages>377-386</pages><issn>0021-9797</issn><issn>1095-7103</issn><eissn>1095-7103</eissn><abstract>Figure. Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode.
[Display omitted]
•The integrated defects are constructed in Li-rich cathodes by Na2SnO3 modification.•The modification improves the cycling stability and suppresses the voltage decay.•The mechanism of enhanced performance by Na2SnO3 modification is revealed.
Li-rich manganese-based oxide (LRMO) is considered one of the most promising cathode materials for next-generation lithium-ion batteries due to its high energy density. However, many issues need to be addressed before its large-scale commercialization, including significant voltage decay and capacity fading. Herein, a Sn4+/Na+ co-doping induced integrated defect structure (oxygen vacancies, stacking faults, and surface spinel phase) strategy is proposed to suppress the voltage decay and enhance the cycling performance of LRMO. The integrated surface defect structures have significantly favorable effects on the LRMO, where the oxygen vacancies remove surface labile oxygen and suppress surface oxygen release, the induced stacking faults alleviate the stress accumulation during cycling, the surface spinel phase promotes the Li+ diffusion and prevents the outward migration of cations, and the co-doped Sn4+/Na+ stabilize the layered structure. As a result, the modified sample Na2SnO3-1 % (NSO-1) achieves excellent cycling performance (capacity of 207 mAh/g and capacity retention of 96.71 % after 100 cycles at 0.5C) and a smaller voltage decay (less than 1.5 mV per cycle) compared with the unmodified LRMO. This work provides a new valuable strategy to suppress capacity fading and voltage decay of LRMO through dual-element substitution induced surface defect engineering.</abstract><cop>United States</cop><pub>Elsevier Inc</pub><pmid>39153241</pmid><doi>10.1016/j.jcis.2024.08.078</doi><tpages>10</tpages></addata></record> |
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subjects | Capacity fading cathodes commercialization electric potential difference energy density Integrated defect Li-rich manganese-based oxide oxygen Voltage decay |
title | Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode |
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