Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces
Phonon polaritons enable waveguiding and localization of infrared light with extreme confinement and low losses. The spatial propagation and spectral resonances of such polaritons are usually probed with complementary techniques such as near‐field optical microscopy and far‐field reflection spectros...
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description | Phonon polaritons enable waveguiding and localization of infrared light with extreme confinement and low losses. The spatial propagation and spectral resonances of such polaritons are usually probed with complementary techniques such as near‐field optical microscopy and far‐field reflection spectroscopy. Here, infrared‐visible sum‐frequency spectro‐microscopy is introduced as a tool for spectroscopic imaging of phonon polaritons. The technique simultaneously provides sub‐wavelength spatial resolution and highly‐resolved spectral resonance information. This is implemented by resonantly exciting polaritons using a tunable infrared laser and wide‐field microscopic detection of the upconverted light. The technique is employed to image hybridization and strong coupling of localized and propagating surface phonon polaritons in a metasurface of SiC micropillars. Spectro‐microscopy allows to measure the polariton dispersion simultaneously in momentum space by angle‐dependent resonance imaging, and in real space by polariton interferometry. Notably, it is possible to directly image how strong coupling affects the spatial localization of polaritons, inaccessible with conventional spectroscopic techniques. The formation of edge states is observed at excitation frequencies where strong coupling prevents polariton propagation into the metasurface. The technique is applicable to the wide range of polaritonic materials with broken inversion symmetry and can be used as a fast and non‐perturbative tool to image polariton hybridization and propagation.
A non‐linear technique of infrared + visible sum‐frequency spectro‐microscopy is introduced to image phonon polaritons in SiC metasurfaces. This approach allows for access to both the spatial propagation and spectral dispersion of the polaritons with sub‐wavelength spatial resolution. The hybridization and strong coupling of propagating (SPhP) and localized (LSPhP) phonon polaritons and the activation of polaritonic edge states are observed. |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_3070803722</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3093051810</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2987-cc4ca32486b7244b01ae89b5620b44356f6f3c9719c2d432d091cb5f77ae0fe23</originalsourceid><addsrcrecordid>eNqFkU-L1EAQxRtR3HH16lEavHjJWP0vSR-H0dWBXVwYPYdOp3rMknTH7gSZmx_Bz-gnsYdZV_DioSgofu9RvEfISwZrBsDfmm40aw5cMK6gekRWTHFWSNDqMVmBFqrQpawvyLOU7gBAl1A-JReirrXKsyJpP6GdY0g2TL2lxnd052eMDmMYcY75tl_GXz9-XkX8tqC3R7obzaH3Bxoc3WelPwxHug3LNGBHb78GHzy9DYOJ_Rx8or2n-35Lb3A2aYnOWEzPyRNnhoQv7vcl-XL1_vP2Y3H96cNuu7kuLNd1VVgrrRFc1mVbcSlbYAZr3aqSQyulUKUrnbC6YtryTgregWa2Va6qDIJDLi7Jm7PvFEP-Pc3N2CeLw2A8hiU1AiqoQVT8hL7-B70LS_T5u0xpAYrVDDK1PlM2B5YiumaK_WjisWHQnOpoTnU0D3Vkwat726UdsXvA_-SfAX0GvvcDHv9j12ze3Wz-mv8GFlCYLg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3093051810</pqid></control><display><type>article</type><title>Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces</title><source>Wiley Online Library All Journals</source><creator>Niemann, Richarda ; Mueller, Niclas S. ; Wasserroth, Sören ; Lu, Guanyu ; Wolf, Martin ; Caldwell, Joshua D. ; Paarmann, Alexander</creator><creatorcontrib>Niemann, Richarda ; Mueller, Niclas S. ; Wasserroth, Sören ; Lu, Guanyu ; Wolf, Martin ; Caldwell, Joshua D. ; Paarmann, Alexander</creatorcontrib><description>Phonon polaritons enable waveguiding and localization of infrared light with extreme confinement and low losses. The spatial propagation and spectral resonances of such polaritons are usually probed with complementary techniques such as near‐field optical microscopy and far‐field reflection spectroscopy. Here, infrared‐visible sum‐frequency spectro‐microscopy is introduced as a tool for spectroscopic imaging of phonon polaritons. The technique simultaneously provides sub‐wavelength spatial resolution and highly‐resolved spectral resonance information. This is implemented by resonantly exciting polaritons using a tunable infrared laser and wide‐field microscopic detection of the upconverted light. The technique is employed to image hybridization and strong coupling of localized and propagating surface phonon polaritons in a metasurface of SiC micropillars. Spectro‐microscopy allows to measure the polariton dispersion simultaneously in momentum space by angle‐dependent resonance imaging, and in real space by polariton interferometry. Notably, it is possible to directly image how strong coupling affects the spatial localization of polaritons, inaccessible with conventional spectroscopic techniques. The formation of edge states is observed at excitation frequencies where strong coupling prevents polariton propagation into the metasurface. The technique is applicable to the wide range of polaritonic materials with broken inversion symmetry and can be used as a fast and non‐perturbative tool to image polariton hybridization and propagation.
A non‐linear technique of infrared + visible sum‐frequency spectro‐microscopy is introduced to image phonon polaritons in SiC metasurfaces. This approach allows for access to both the spatial propagation and spectral dispersion of the polaritons with sub‐wavelength spatial resolution. The hybridization and strong coupling of propagating (SPhP) and localized (LSPhP) phonon polaritons and the activation of polaritonic edge states are observed.</description><identifier>ISSN: 0935-9648</identifier><identifier>ISSN: 1521-4095</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.202312507</identifier><identifier>PMID: 38895889</identifier><language>eng</language><publisher>Germany: Wiley Subscription Services, Inc</publisher><subject>Coupling ; Excitation spectra ; Infrared imagery ; Infrared imaging ; Infrared lasers ; Infrared reflection ; Infrared spectroscopy ; Interferometry ; Light reflection ; Localization ; metasurface ; Metasurfaces ; Microscopy ; nonlinear ; Optical microscopy ; phonon polariton ; Phonons ; polariton interferometry ; Polaritons ; Propagation ; Resonance ; Spatial resolution ; strong coupling ; sum‐frequency generation ; Tunable lasers ; Wave propagation</subject><ispartof>Advanced materials (Weinheim), 2024-08, Vol.36 (33), p.e2312507-n/a</ispartof><rights>2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH</rights><rights>2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH.</rights><rights>2024. This article is published under http://creativecommons.org/licenses/by-nc/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2987-cc4ca32486b7244b01ae89b5620b44356f6f3c9719c2d432d091cb5f77ae0fe23</cites><orcidid>0000-0002-8271-2284 ; 0000-0002-8688-1974 ; 0000-0003-4935-7062</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadma.202312507$$EPDF$$P50$$Gwiley$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadma.202312507$$EHTML$$P50$$Gwiley$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,1411,27903,27904,45553,45554</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/38895889$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Niemann, Richarda</creatorcontrib><creatorcontrib>Mueller, Niclas S.</creatorcontrib><creatorcontrib>Wasserroth, Sören</creatorcontrib><creatorcontrib>Lu, Guanyu</creatorcontrib><creatorcontrib>Wolf, Martin</creatorcontrib><creatorcontrib>Caldwell, Joshua D.</creatorcontrib><creatorcontrib>Paarmann, Alexander</creatorcontrib><title>Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces</title><title>Advanced materials (Weinheim)</title><addtitle>Adv Mater</addtitle><description>Phonon polaritons enable waveguiding and localization of infrared light with extreme confinement and low losses. The spatial propagation and spectral resonances of such polaritons are usually probed with complementary techniques such as near‐field optical microscopy and far‐field reflection spectroscopy. Here, infrared‐visible sum‐frequency spectro‐microscopy is introduced as a tool for spectroscopic imaging of phonon polaritons. The technique simultaneously provides sub‐wavelength spatial resolution and highly‐resolved spectral resonance information. This is implemented by resonantly exciting polaritons using a tunable infrared laser and wide‐field microscopic detection of the upconverted light. The technique is employed to image hybridization and strong coupling of localized and propagating surface phonon polaritons in a metasurface of SiC micropillars. Spectro‐microscopy allows to measure the polariton dispersion simultaneously in momentum space by angle‐dependent resonance imaging, and in real space by polariton interferometry. Notably, it is possible to directly image how strong coupling affects the spatial localization of polaritons, inaccessible with conventional spectroscopic techniques. The formation of edge states is observed at excitation frequencies where strong coupling prevents polariton propagation into the metasurface. The technique is applicable to the wide range of polaritonic materials with broken inversion symmetry and can be used as a fast and non‐perturbative tool to image polariton hybridization and propagation.
A non‐linear technique of infrared + visible sum‐frequency spectro‐microscopy is introduced to image phonon polaritons in SiC metasurfaces. This approach allows for access to both the spatial propagation and spectral dispersion of the polaritons with sub‐wavelength spatial resolution. The hybridization and strong coupling of propagating (SPhP) and localized (LSPhP) phonon polaritons and the activation of polaritonic edge states are observed.</description><subject>Coupling</subject><subject>Excitation spectra</subject><subject>Infrared imagery</subject><subject>Infrared imaging</subject><subject>Infrared lasers</subject><subject>Infrared reflection</subject><subject>Infrared spectroscopy</subject><subject>Interferometry</subject><subject>Light reflection</subject><subject>Localization</subject><subject>metasurface</subject><subject>Metasurfaces</subject><subject>Microscopy</subject><subject>nonlinear</subject><subject>Optical microscopy</subject><subject>phonon polariton</subject><subject>Phonons</subject><subject>polariton interferometry</subject><subject>Polaritons</subject><subject>Propagation</subject><subject>Resonance</subject><subject>Spatial resolution</subject><subject>strong coupling</subject><subject>sum‐frequency generation</subject><subject>Tunable lasers</subject><subject>Wave propagation</subject><issn>0935-9648</issn><issn>1521-4095</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><sourceid>WIN</sourceid><recordid>eNqFkU-L1EAQxRtR3HH16lEavHjJWP0vSR-H0dWBXVwYPYdOp3rMknTH7gSZmx_Bz-gnsYdZV_DioSgofu9RvEfISwZrBsDfmm40aw5cMK6gekRWTHFWSNDqMVmBFqrQpawvyLOU7gBAl1A-JReirrXKsyJpP6GdY0g2TL2lxnd052eMDmMYcY75tl_GXz9-XkX8tqC3R7obzaH3Bxoc3WelPwxHug3LNGBHb78GHzy9DYOJ_Rx8or2n-35Lb3A2aYnOWEzPyRNnhoQv7vcl-XL1_vP2Y3H96cNuu7kuLNd1VVgrrRFc1mVbcSlbYAZr3aqSQyulUKUrnbC6YtryTgregWa2Va6qDIJDLi7Jm7PvFEP-Pc3N2CeLw2A8hiU1AiqoQVT8hL7-B70LS_T5u0xpAYrVDDK1PlM2B5YiumaK_WjisWHQnOpoTnU0D3Vkwat726UdsXvA_-SfAX0GvvcDHv9j12ze3Wz-mv8GFlCYLg</recordid><startdate>20240801</startdate><enddate>20240801</enddate><creator>Niemann, Richarda</creator><creator>Mueller, Niclas S.</creator><creator>Wasserroth, Sören</creator><creator>Lu, Guanyu</creator><creator>Wolf, Martin</creator><creator>Caldwell, Joshua D.</creator><creator>Paarmann, Alexander</creator><general>Wiley Subscription Services, Inc</general><scope>24P</scope><scope>WIN</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-8271-2284</orcidid><orcidid>https://orcid.org/0000-0002-8688-1974</orcidid><orcidid>https://orcid.org/0000-0003-4935-7062</orcidid></search><sort><creationdate>20240801</creationdate><title>Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces</title><author>Niemann, Richarda ; Mueller, Niclas S. ; Wasserroth, Sören ; Lu, Guanyu ; Wolf, Martin ; Caldwell, Joshua D. ; Paarmann, Alexander</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2987-cc4ca32486b7244b01ae89b5620b44356f6f3c9719c2d432d091cb5f77ae0fe23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Coupling</topic><topic>Excitation spectra</topic><topic>Infrared imagery</topic><topic>Infrared imaging</topic><topic>Infrared lasers</topic><topic>Infrared reflection</topic><topic>Infrared spectroscopy</topic><topic>Interferometry</topic><topic>Light reflection</topic><topic>Localization</topic><topic>metasurface</topic><topic>Metasurfaces</topic><topic>Microscopy</topic><topic>nonlinear</topic><topic>Optical microscopy</topic><topic>phonon polariton</topic><topic>Phonons</topic><topic>polariton interferometry</topic><topic>Polaritons</topic><topic>Propagation</topic><topic>Resonance</topic><topic>Spatial resolution</topic><topic>strong coupling</topic><topic>sum‐frequency generation</topic><topic>Tunable lasers</topic><topic>Wave propagation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Niemann, Richarda</creatorcontrib><creatorcontrib>Mueller, Niclas S.</creatorcontrib><creatorcontrib>Wasserroth, Sören</creatorcontrib><creatorcontrib>Lu, Guanyu</creatorcontrib><creatorcontrib>Wolf, Martin</creatorcontrib><creatorcontrib>Caldwell, Joshua D.</creatorcontrib><creatorcontrib>Paarmann, Alexander</creatorcontrib><collection>Wiley Open Access</collection><collection>Wiley Online Library Free Content</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>MEDLINE - Academic</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Niemann, Richarda</au><au>Mueller, Niclas S.</au><au>Wasserroth, Sören</au><au>Lu, Guanyu</au><au>Wolf, Martin</au><au>Caldwell, Joshua D.</au><au>Paarmann, Alexander</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv Mater</addtitle><date>2024-08-01</date><risdate>2024</risdate><volume>36</volume><issue>33</issue><spage>e2312507</spage><epage>n/a</epage><pages>e2312507-n/a</pages><issn>0935-9648</issn><issn>1521-4095</issn><eissn>1521-4095</eissn><abstract>Phonon polaritons enable waveguiding and localization of infrared light with extreme confinement and low losses. The spatial propagation and spectral resonances of such polaritons are usually probed with complementary techniques such as near‐field optical microscopy and far‐field reflection spectroscopy. Here, infrared‐visible sum‐frequency spectro‐microscopy is introduced as a tool for spectroscopic imaging of phonon polaritons. The technique simultaneously provides sub‐wavelength spatial resolution and highly‐resolved spectral resonance information. This is implemented by resonantly exciting polaritons using a tunable infrared laser and wide‐field microscopic detection of the upconverted light. The technique is employed to image hybridization and strong coupling of localized and propagating surface phonon polaritons in a metasurface of SiC micropillars. Spectro‐microscopy allows to measure the polariton dispersion simultaneously in momentum space by angle‐dependent resonance imaging, and in real space by polariton interferometry. Notably, it is possible to directly image how strong coupling affects the spatial localization of polaritons, inaccessible with conventional spectroscopic techniques. The formation of edge states is observed at excitation frequencies where strong coupling prevents polariton propagation into the metasurface. The technique is applicable to the wide range of polaritonic materials with broken inversion symmetry and can be used as a fast and non‐perturbative tool to image polariton hybridization and propagation.
A non‐linear technique of infrared + visible sum‐frequency spectro‐microscopy is introduced to image phonon polaritons in SiC metasurfaces. This approach allows for access to both the spatial propagation and spectral dispersion of the polaritons with sub‐wavelength spatial resolution. The hybridization and strong coupling of propagating (SPhP) and localized (LSPhP) phonon polaritons and the activation of polaritonic edge states are observed.</abstract><cop>Germany</cop><pub>Wiley Subscription Services, Inc</pub><pmid>38895889</pmid><doi>10.1002/adma.202312507</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-8271-2284</orcidid><orcidid>https://orcid.org/0000-0002-8688-1974</orcidid><orcidid>https://orcid.org/0000-0003-4935-7062</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Coupling Excitation spectra Infrared imagery Infrared imaging Infrared lasers Infrared reflection Infrared spectroscopy Interferometry Light reflection Localization metasurface Metasurfaces Microscopy nonlinear Optical microscopy phonon polariton Phonons polariton interferometry Polaritons Propagation Resonance Spatial resolution strong coupling sum‐frequency generation Tunable lasers Wave propagation |
title | Spectroscopic and Interferometric Sum‐Frequency Imaging of Strongly Coupled Phonon Polaritons in SiC Metasurfaces |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T17%3A51%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Spectroscopic%20and%20Interferometric%20Sum%E2%80%90Frequency%20Imaging%20of%20Strongly%20Coupled%20Phonon%20Polaritons%20in%20SiC%20Metasurfaces&rft.jtitle=Advanced%20materials%20(Weinheim)&rft.au=Niemann,%20Richarda&rft.date=2024-08-01&rft.volume=36&rft.issue=33&rft.spage=e2312507&rft.epage=n/a&rft.pages=e2312507-n/a&rft.issn=0935-9648&rft.eissn=1521-4095&rft_id=info:doi/10.1002/adma.202312507&rft_dat=%3Cproquest_cross%3E3093051810%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3093051810&rft_id=info:pmid/38895889&rfr_iscdi=true |