NiO thickness measurement using a rectangular-type Sagnac interferometer as the material transport layer in a perovskite solar cell

This work aims to utilize a phase-shifting technique in a rectangular-type Sagnac interferometer (RTSI) to measure the thickness of a thin film of nickel (II) oxide (NiO) in an electron transport layer (ETL) in perovskite solar cell preparation. The NiO layer is deposited on a fluorine-doped tin oxi...

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Veröffentlicht in:	Applied optics (2004) 2024-04, Vol.63 (11), p.2868-2875
Hauptverfasser:	Usman, Abdullahi, Bhatranand, Apichai, Jiraraksopakun, Yuttapong, Sabo Muhammad, Khalid, Buranasiri, Prathan
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Electron transport Fluorine Glass substrates Interferometers Nickel oxides Perovskites Photovoltaic cells Scanning electron microscopy Solar cells Thickness measurement Thin films Tin oxides
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