Fractioned-pattern radiation mapping, Part II: assessment

Fractioned-pattern radiation mapping, Part II: assessment

In Part I, the authors proposed a theoretical background for predicting the radiation distribution in any optical system based on decomposing the emitting source power. Here, we describe the validity of this decomposition through a practical example that uses a radiating source and a single surface...

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Veröffentlicht in:Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 2024-06, Vol.41 (6), p.1114-1121
Hauptverfasser: Valencia Estrada, Juan Camilo, Garcia-Marquez, Jorge, Espinoza-Garcia, Adrian Alejandro, Lartigue, Clement, Etienne, Romain, Dupont, Philippe
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container_end_page 1121
container_issue 6
container_start_page 1114
container_title Journal of the Optical Society of America. A, Optics, image science, and vision
container_volume 41
creator Valencia Estrada, Juan Camilo
Garcia-Marquez, Jorge
Espinoza-Garcia, Adrian Alejandro
Lartigue, Clement
Etienne, Romain
Dupont, Philippe
description In Part I, the authors proposed a theoretical background for predicting the radiation distribution in any optical system based on decomposing the emitting source power. Here, we describe the validity of this decomposition through a practical example that uses a radiating source and a single surface optical system. This source is calibrated in a metrology testbed that guarantees its traceability to the candela (cd), the International System (SI) base unit for luminous intensity . A second example, this time numerical, shows the method's performance in a multisurface optical system.
doi_str_mv 10.1364/JOSAA.518373
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_3066335044</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3066335044</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-b81a689187c1510ecbd390da3282eddb33179b4dbaf4e07bb4d06b8788b6e0973</originalsourceid><addsrcrecordid>eNo9kDtPwzAYRS0EoqWwMaOMDE2x_fnJVlUUgioVCZgjO3ZRUPPAdgf-PSktTPfq6ugOB6FrgmcEBLt7Xr_O5zNOFEg4QWPCKc4VB3o6dKxYLjnVI3QR4yfGmAklz9EIlOKCUT5GehlMlequ9S7vTUo-tFkwrjb7LWtM39ftxzR7MSFlRXGfmRh9jI1v0yU625ht9FfHnKD35cPb4ilfrR-LxXyVV1STlFtFjFCaKFkRTrCvrAONnQGqqHfOAhCpLXPWbJjH0g4VC6ukUlZ4rCVM0O3htw_d187HVDZ1rPx2a1rf7WIJWAgAjhkb0OkBrUIXY_Cbsg91Y8J3SXC5l1X-yioPsgb85vi8s413__CfHfgB1iljwA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3066335044</pqid></control><display><type>article</type><title>Fractioned-pattern radiation mapping, Part II: assessment</title><source>Optica Publishing Group Journals</source><creator>Valencia Estrada, Juan Camilo ; Garcia-Marquez, Jorge ; Espinoza-Garcia, Adrian Alejandro ; Lartigue, Clement ; Etienne, Romain ; Dupont, Philippe</creator><creatorcontrib>Valencia Estrada, Juan Camilo ; Garcia-Marquez, Jorge ; Espinoza-Garcia, Adrian Alejandro ; Lartigue, Clement ; Etienne, Romain ; Dupont, Philippe</creatorcontrib><description>In Part I, the authors proposed a theoretical background for predicting the radiation distribution in any optical system based on decomposing the emitting source power. Here, we describe the validity of this decomposition through a practical example that uses a radiating source and a single surface optical system. This source is calibrated in a metrology testbed that guarantees its traceability to the candela (cd), the International System (SI) base unit for luminous intensity . A second example, this time numerical, shows the method's performance in a multisurface optical system.</description><identifier>ISSN: 1084-7529</identifier><identifier>EISSN: 1520-8532</identifier><identifier>DOI: 10.1364/JOSAA.518373</identifier><identifier>PMID: 38856425</identifier><language>eng</language><publisher>United States</publisher><ispartof>Journal of the Optical Society of America. A, Optics, image science, and vision, 2024-06, Vol.41 (6), p.1114-1121</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-b81a689187c1510ecbd390da3282eddb33179b4dbaf4e07bb4d06b8788b6e0973</citedby><cites>FETCH-LOGICAL-c291t-b81a689187c1510ecbd390da3282eddb33179b4dbaf4e07bb4d06b8788b6e0973</cites><orcidid>0000-0002-6611-1614 ; 0000-0003-2860-1222</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,3249,27915,27916</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/38856425$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Valencia Estrada, Juan Camilo</creatorcontrib><creatorcontrib>Garcia-Marquez, Jorge</creatorcontrib><creatorcontrib>Espinoza-Garcia, Adrian Alejandro</creatorcontrib><creatorcontrib>Lartigue, Clement</creatorcontrib><creatorcontrib>Etienne, Romain</creatorcontrib><creatorcontrib>Dupont, Philippe</creatorcontrib><title>Fractioned-pattern radiation mapping, Part II: assessment</title><title>Journal of the Optical Society of America. A, Optics, image science, and vision</title><addtitle>J Opt Soc Am A Opt Image Sci Vis</addtitle><description>In Part I, the authors proposed a theoretical background for predicting the radiation distribution in any optical system based on decomposing the emitting source power. Here, we describe the validity of this decomposition through a practical example that uses a radiating source and a single surface optical system. This source is calibrated in a metrology testbed that guarantees its traceability to the candela (cd), the International System (SI) base unit for luminous intensity . A second example, this time numerical, shows the method's performance in a multisurface optical system.</description><issn>1084-7529</issn><issn>1520-8532</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNo9kDtPwzAYRS0EoqWwMaOMDE2x_fnJVlUUgioVCZgjO3ZRUPPAdgf-PSktTPfq6ugOB6FrgmcEBLt7Xr_O5zNOFEg4QWPCKc4VB3o6dKxYLjnVI3QR4yfGmAklz9EIlOKCUT5GehlMlequ9S7vTUo-tFkwrjb7LWtM39ftxzR7MSFlRXGfmRh9jI1v0yU625ht9FfHnKD35cPb4ilfrR-LxXyVV1STlFtFjFCaKFkRTrCvrAONnQGqqHfOAhCpLXPWbJjH0g4VC6ukUlZ4rCVM0O3htw_d187HVDZ1rPx2a1rf7WIJWAgAjhkb0OkBrUIXY_Cbsg91Y8J3SXC5l1X-yioPsgb85vi8s413__CfHfgB1iljwA</recordid><startdate>20240601</startdate><enddate>20240601</enddate><creator>Valencia Estrada, Juan Camilo</creator><creator>Garcia-Marquez, Jorge</creator><creator>Espinoza-Garcia, Adrian Alejandro</creator><creator>Lartigue, Clement</creator><creator>Etienne, Romain</creator><creator>Dupont, Philippe</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-6611-1614</orcidid><orcidid>https://orcid.org/0000-0003-2860-1222</orcidid></search><sort><creationdate>20240601</creationdate><title>Fractioned-pattern radiation mapping, Part II: assessment</title><author>Valencia Estrada, Juan Camilo ; Garcia-Marquez, Jorge ; Espinoza-Garcia, Adrian Alejandro ; Lartigue, Clement ; Etienne, Romain ; Dupont, Philippe</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-b81a689187c1510ecbd390da3282eddb33179b4dbaf4e07bb4d06b8788b6e0973</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Valencia Estrada, Juan Camilo</creatorcontrib><creatorcontrib>Garcia-Marquez, Jorge</creatorcontrib><creatorcontrib>Espinoza-Garcia, Adrian Alejandro</creatorcontrib><creatorcontrib>Lartigue, Clement</creatorcontrib><creatorcontrib>Etienne, Romain</creatorcontrib><creatorcontrib>Dupont, Philippe</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of the Optical Society of America. A, Optics, image science, and vision</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Valencia Estrada, Juan Camilo</au><au>Garcia-Marquez, Jorge</au><au>Espinoza-Garcia, Adrian Alejandro</au><au>Lartigue, Clement</au><au>Etienne, Romain</au><au>Dupont, Philippe</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fractioned-pattern radiation mapping, Part II: assessment</atitle><jtitle>Journal of the Optical Society of America. A, Optics, image science, and vision</jtitle><addtitle>J Opt Soc Am A Opt Image Sci Vis</addtitle><date>2024-06-01</date><risdate>2024</risdate><volume>41</volume><issue>6</issue><spage>1114</spage><epage>1121</epage><pages>1114-1121</pages><issn>1084-7529</issn><eissn>1520-8532</eissn><abstract>In Part I, the authors proposed a theoretical background for predicting the radiation distribution in any optical system based on decomposing the emitting source power. Here, we describe the validity of this decomposition through a practical example that uses a radiating source and a single surface optical system. This source is calibrated in a metrology testbed that guarantees its traceability to the candela (cd), the International System (SI) base unit for luminous intensity . A second example, this time numerical, shows the method's performance in a multisurface optical system.</abstract><cop>United States</cop><pmid>38856425</pmid><doi>10.1364/JOSAA.518373</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-6611-1614</orcidid><orcidid>https://orcid.org/0000-0003-2860-1222</orcidid></addata></record>
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language eng
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url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T03%3A18%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fractioned-pattern%20radiation%20mapping,%20Part%20II:%20assessment&rft.jtitle=Journal%20of%20the%20Optical%20Society%20of%20America.%20A,%20Optics,%20image%20science,%20and%20vision&rft.au=Valencia%20Estrada,%20Juan%20Camilo&rft.date=2024-06-01&rft.volume=41&rft.issue=6&rft.spage=1114&rft.epage=1121&rft.pages=1114-1121&rft.issn=1084-7529&rft.eissn=1520-8532&rft_id=info:doi/10.1364/JOSAA.518373&rft_dat=%3Cproquest_cross%3E3066335044%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3066335044&rft_id=info:pmid/38856425&rfr_iscdi=true