High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy

The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This techn...

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Veröffentlicht in:Nano letters 2024-05, Vol.24 (20), p.6124-6130
Hauptverfasser: Wu, Gang, Lv, Wen-Li, Qian, Chen, Liu, Xian-Wei
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container_title Nano letters
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creator Wu, Gang
Lv, Wen-Li
Qian, Chen
Liu, Xian-Wei
description The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_3052594924</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3052594924</sourcerecordid><originalsourceid>FETCH-LOGICAL-a297t-84ba3a3cd59d0766ec08ea5e929c0fbf3eef29f501156bb1e37c5e478c7b0e803</originalsourceid><addsrcrecordid>eNp9kc1u1DAURi0EoqXwBgh5ySbDdRxP4mVVFTpS-REt68hxrmdcOXawHaR5EN4XT2faJStfyec719ZHyHsGKwY1-6R0Wnnlg8OcV40GxnnzgpwzwaFaS1m_fJ675oy8SekBACQX8Jqc8a5lLe-6c_L3xm531f0uhmW7m5dMNyP6bI3VKtvgaTD0zvqtQ_qt7JpVzFY7TPSPVfTaoc4x6B1OBXduTy9TsinjSB-tPzEFtzxqfjiVpuCtpndFnDEWJ934MhiMYcIcy9VXq2NIOsz7t-SVUS7hu9N5QX59vr6_uqluv3_ZXF3eVqqWba66ZlBccT0KOUK7XqOGDpVAWUsNZjAc0dTSCGBMrIeBIW-1wKbtdDsAdsAvyMejd47h94Ip95NNGp1THsOSeg6iFrKRdVPQ5oge3pgimn6OdlJx3zPoD4X0pZD-qZD-VEiJfThtWIYJx-fQUwMFgCNwiD-EJfry4f87_wGLuaAV</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3052594924</pqid></control><display><type>article</type><title>High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy</title><source>ACS Publications</source><creator>Wu, Gang ; Lv, Wen-Li ; Qian, Chen ; Liu, Xian-Wei</creator><creatorcontrib>Wu, Gang ; Lv, Wen-Li ; Qian, Chen ; Liu, Xian-Wei</creatorcontrib><description>The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.</description><identifier>ISSN: 1530-6984</identifier><identifier>EISSN: 1530-6992</identifier><identifier>DOI: 10.1021/acs.nanolett.4c01334</identifier><identifier>PMID: 38717388</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><ispartof>Nano letters, 2024-05, Vol.24 (20), p.6124-6130</ispartof><rights>2024 American Chemical Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-a297t-84ba3a3cd59d0766ec08ea5e929c0fbf3eef29f501156bb1e37c5e478c7b0e803</cites><orcidid>0000-0002-0493-8210</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acs.nanolett.4c01334$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acs.nanolett.4c01334$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,777,781,2752,27057,27905,27906,56719,56769</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/38717388$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wu, Gang</creatorcontrib><creatorcontrib>Lv, Wen-Li</creatorcontrib><creatorcontrib>Qian, Chen</creatorcontrib><creatorcontrib>Liu, Xian-Wei</creatorcontrib><title>High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy</title><title>Nano letters</title><addtitle>Nano Lett</addtitle><description>The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.</description><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kc1u1DAURi0EoqXwBgh5ySbDdRxP4mVVFTpS-REt68hxrmdcOXawHaR5EN4XT2faJStfyec719ZHyHsGKwY1-6R0Wnnlg8OcV40GxnnzgpwzwaFaS1m_fJ675oy8SekBACQX8Jqc8a5lLe-6c_L3xm531f0uhmW7m5dMNyP6bI3VKtvgaTD0zvqtQ_qt7JpVzFY7TPSPVfTaoc4x6B1OBXduTy9TsinjSB-tPzEFtzxqfjiVpuCtpndFnDEWJ934MhiMYcIcy9VXq2NIOsz7t-SVUS7hu9N5QX59vr6_uqluv3_ZXF3eVqqWba66ZlBccT0KOUK7XqOGDpVAWUsNZjAc0dTSCGBMrIeBIW-1wKbtdDsAdsAvyMejd47h94Ip95NNGp1THsOSeg6iFrKRdVPQ5oge3pgimn6OdlJx3zPoD4X0pZD-qZD-VEiJfThtWIYJx-fQUwMFgCNwiD-EJfry4f87_wGLuaAV</recordid><startdate>20240522</startdate><enddate>20240522</enddate><creator>Wu, Gang</creator><creator>Lv, Wen-Li</creator><creator>Qian, Chen</creator><creator>Liu, Xian-Wei</creator><general>American Chemical Society</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-0493-8210</orcidid></search><sort><creationdate>20240522</creationdate><title>High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy</title><author>Wu, Gang ; Lv, Wen-Li ; Qian, Chen ; Liu, Xian-Wei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a297t-84ba3a3cd59d0766ec08ea5e929c0fbf3eef29f501156bb1e37c5e478c7b0e803</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, Gang</creatorcontrib><creatorcontrib>Lv, Wen-Li</creatorcontrib><creatorcontrib>Qian, Chen</creatorcontrib><creatorcontrib>Liu, Xian-Wei</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wu, Gang</au><au>Lv, Wen-Li</au><au>Qian, Chen</au><au>Liu, Xian-Wei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-Throughput Identification of Single Nanoparticles via Electrochemically Assisted High-Resolution Plasmonic Scattering Interferometric Microscopy</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2024-05-22</date><risdate>2024</risdate><volume>24</volume><issue>20</issue><spage>6124</spage><epage>6130</epage><pages>6124-6130</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>38717388</pmid><doi>10.1021/acs.nanolett.4c01334</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-0493-8210</orcidid></addata></record>
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url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T02%3A57%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High-Throughput%20Identification%20of%20Single%20Nanoparticles%20via%20Electrochemically%20Assisted%20High-Resolution%20Plasmonic%20Scattering%20Interferometric%20Microscopy&rft.jtitle=Nano%20letters&rft.au=Wu,%20Gang&rft.date=2024-05-22&rft.volume=24&rft.issue=20&rft.spage=6124&rft.epage=6130&rft.pages=6124-6130&rft.issn=1530-6984&rft.eissn=1530-6992&rft_id=info:doi/10.1021/acs.nanolett.4c01334&rft_dat=%3Cproquest_cross%3E3052594924%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3052594924&rft_id=info:pmid/38717388&rfr_iscdi=true