Electric Field Manipulation of Defects and Schottky Barrier Control inside ZnO Nanowires

We directly measure the three-dimensional movement of intrinsic point defects driven by applied electric fields inside ZnO nano- and micro-wire metal–semiconductor–metal device structures. Using depth- and spatially resolved cathodoluminescence spectroscopy (CLS) in situ to map the spatial distribut...

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Veröffentlicht in:	ACS applied materials & interfaces 2023-06, Vol.15 (25), p.30944-30955
Hauptverfasser:	Haseman, Micah S., Gao, Hantian, Duddella, Kalpak, Brillson, Leonard J.
Format:	Artikel
Sprache:	eng
Schlagworte:	electric field electric potential difference nanowires Surfaces, Interfaces, and Applications X-ray photoelectron spectroscopy
Online-Zugang:	Volltext
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