In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85
(AgSbTe₂)₁₅(GeTe)₈₅ (TAGS-85) is a p-type semiconductor characterized by a maximum dimensionless thermoelectric figure of merit of 1.4–1.7 at elevated temperature. In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using...
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| Veröffentlicht in: | Journal of materials science 2007-09, Vol.42 (18), p.7643-7646 |
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| container_title | Journal of materials science |
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| creator | Cook, Bruce A Wei, Xuezheng Harringa, Joel L Kramer, Matthew J |
| description | (AgSbTe₂)₁₅(GeTe)₈₅ (TAGS-85) is a p-type semiconductor characterized by a maximum dimensionless thermoelectric figure of merit of 1.4–1.7 at elevated temperature. In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using TEM. At room temperature, pervasive twinning was observed throughout the specimen. Upon heating to above 120 °C, some of the twins dissolved and new point defects began to nucleate. The mechanisms responsible for formation of high temperature defects are discussed. |
| doi_str_mv | 10.1007/s10853-007-1898-x |
| format | Article |
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In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using TEM. At room temperature, pervasive twinning was observed throughout the specimen. Upon heating to above 120 °C, some of the twins dissolved and new point defects began to nucleate. The mechanisms responsible for formation of high temperature defects are discussed.</description><identifier>ISSN: 0022-2461</identifier><identifier>EISSN: 1573-4803</identifier><identifier>DOI: 10.1007/s10853-007-1898-x</identifier><identifier>CODEN: JMTSAS</identifier><language>eng</language><publisher>Heidelberg: Kluwer Academic Publishers-Plenum Publishers</publisher><subject>ambient temperature ; antimony ; Condensed matter: structure, mechanical and thermal properties ; Defects and impurities in crystals; microstructure ; Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) ; Electron, ion, and scanning probe microscopy ; Exact sciences and technology ; Figure of merit ; germanium ; heat ; High temperature ; Materials science ; microstructure ; P-type semiconductors ; Physics ; Point defects ; semiconductors ; silver ; Silver antimony telluride ; Structure of solids and liquids; crystallography ; Tags ; tellurium ; transmission electron microscopy ; Transmission, reflection and scanning electron microscopy(including ebic) ; Twinning ; twins</subject><ispartof>Journal of materials science, 2007-09, Vol.42 (18), p.7643-7646</ispartof><rights>2007 INIST-CNRS</rights><rights>Journal of Materials Science is a copyright of Springer, (2007). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c273t-7d692d05f69b20bd08f456b3a6cd1df07d12c49af6846c4599c97499efdb582a3</citedby><cites>FETCH-LOGICAL-c273t-7d692d05f69b20bd08f456b3a6cd1df07d12c49af6846c4599c97499efdb582a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18969577$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Cook, Bruce A</creatorcontrib><creatorcontrib>Wei, Xuezheng</creatorcontrib><creatorcontrib>Harringa, Joel L</creatorcontrib><creatorcontrib>Kramer, Matthew J</creatorcontrib><title>In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85</title><title>Journal of materials science</title><description>(AgSbTe₂)₁₅(GeTe)₈₅ (TAGS-85) is a p-type semiconductor characterized by a maximum dimensionless thermoelectric figure of merit of 1.4–1.7 at elevated temperature. In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using TEM. At room temperature, pervasive twinning was observed throughout the specimen. Upon heating to above 120 °C, some of the twins dissolved and new point defects began to nucleate. The mechanisms responsible for formation of high temperature defects are discussed.</description><subject>ambient temperature</subject><subject>antimony</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)</subject><subject>Electron, ion, and scanning probe microscopy</subject><subject>Exact sciences and technology</subject><subject>Figure of merit</subject><subject>germanium</subject><subject>heat</subject><subject>High temperature</subject><subject>Materials science</subject><subject>microstructure</subject><subject>P-type semiconductors</subject><subject>Physics</subject><subject>Point defects</subject><subject>semiconductors</subject><subject>silver</subject><subject>Silver antimony telluride</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Tags</subject><subject>tellurium</subject><subject>transmission electron microscopy</subject><subject>Transmission, reflection and scanning electron microscopy(including ebic)</subject><subject>Twinning</subject><subject>twins</subject><issn>0022-2461</issn><issn>1573-4803</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNpdkEtLAzEUhYMoWKs_wJUDothF9CaZvBYuROoDKi7arkMmj1KZdmoyI_rvndKC4OqexXcOlw-hcwK3BEDeZQKKM9xHTJRW-PsADQiXDJcK2CEaAFCKaSnIMTrJ-QMAuKRkgO5f1zgv264IdfiybfC4DatNSLbtUihm47cit53_KZpY3DwsptUs0BHhN89hFkaKn6KjaOsczvZ3iOZP49njC568P78-Pkywo5K1WHqhqQceha4oVB5ULLmomBXOEx9BekJdqW0UqhSu5Fo7LUutQ_QVV9SyIbre7W5S89mF3JrVMrtQ13Ydmi4bBsCYEqIHL_-BH02X1v1vhlKuJZUCthTZUS41OacQzSYtVzb9GAJmq9PsdJpt3Oo0333nar9ss7N1THbtlvmvqLTQXMqeu9hx0TbGLlLPzKcUiOiV054A9gtGtnri</recordid><startdate>200709</startdate><enddate>200709</enddate><creator>Cook, Bruce A</creator><creator>Wei, Xuezheng</creator><creator>Harringa, Joel L</creator><creator>Kramer, Matthew J</creator><general>Kluwer Academic Publishers-Plenum Publishers</general><general>Springer</general><general>Springer Nature B.V</general><scope>FBQ</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>200709</creationdate><title>In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85</title><author>Cook, Bruce A ; Wei, Xuezheng ; Harringa, Joel L ; Kramer, Matthew J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c273t-7d692d05f69b20bd08f456b3a6cd1df07d12c49af6846c4599c97499efdb582a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>ambient temperature</topic><topic>antimony</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.)</topic><topic>Electron, ion, and scanning probe microscopy</topic><topic>Exact sciences and technology</topic><topic>Figure of merit</topic><topic>germanium</topic><topic>heat</topic><topic>High temperature</topic><topic>Materials science</topic><topic>microstructure</topic><topic>P-type semiconductors</topic><topic>Physics</topic><topic>Point defects</topic><topic>semiconductors</topic><topic>silver</topic><topic>Silver antimony telluride</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Tags</topic><topic>tellurium</topic><topic>transmission electron microscopy</topic><topic>Transmission, reflection and scanning electron microscopy(including ebic)</topic><topic>Twinning</topic><topic>twins</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cook, Bruce A</creatorcontrib><creatorcontrib>Wei, Xuezheng</creatorcontrib><creatorcontrib>Harringa, Joel L</creatorcontrib><creatorcontrib>Kramer, Matthew J</creatorcontrib><collection>AGRIS</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cook, Bruce A</au><au>Wei, Xuezheng</au><au>Harringa, Joel L</au><au>Kramer, Matthew J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85</atitle><jtitle>Journal of materials science</jtitle><date>2007-09</date><risdate>2007</risdate><volume>42</volume><issue>18</issue><spage>7643</spage><epage>7646</epage><pages>7643-7646</pages><issn>0022-2461</issn><eissn>1573-4803</eissn><coden>JMTSAS</coden><abstract>(AgSbTe₂)₁₅(GeTe)₈₅ (TAGS-85) is a p-type semiconductor characterized by a maximum dimensionless thermoelectric figure of merit of 1.4–1.7 at elevated temperature. In this study, the microstructure of as-solidified TAGS-85 at room temperature and elevated temperature (160 °C) was investigated using TEM. At room temperature, pervasive twinning was observed throughout the specimen. Upon heating to above 120 °C, some of the twins dissolved and new point defects began to nucleate. The mechanisms responsible for formation of high temperature defects are discussed.</abstract><cop>Heidelberg</cop><pub>Kluwer Academic Publishers-Plenum Publishers</pub><doi>10.1007/s10853-007-1898-x</doi><tpages>4</tpages></addata></record> |
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| subjects | ambient temperature antimony Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.) Electron, ion, and scanning probe microscopy Exact sciences and technology Figure of merit germanium heat High temperature Materials science microstructure P-type semiconductors Physics Point defects semiconductors silver Silver antimony telluride Structure of solids and liquids crystallography Tags tellurium transmission electron microscopy Transmission, reflection and scanning electron microscopy(including ebic) Twinning twins |
| title | In-situ elevated-temperature TEM study of (AgSbTe2)15(GeTe)85 |
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