Tunable nonlinear current-voltage characteristic in four-terminal ballistic nano-junctions

We report on low temperature (4.2K - 140K) measurements of four-terminal ballistic nano-junctions, etched on a two-dimensional electron gas confined in an InGaAs/InAlAs heterostructure. A symmetry-breaking artificial scatterer is introduced in the center of the junctions. The geometry of the junctio...

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Veröffentlicht in:Bulletin of the American Physical Society 2004-03, Vol.49 (1)
Hauptverfasser: Hackens, B, Gence, L, Farhi, G, Faniel, S, Gustin, C, Bayot, V, Wallart, X, Bollaert, S, Cappy, A, Vasallo, B G, Mateos, J, Gonzalez, T
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container_title Bulletin of the American Physical Society
container_volume 49
creator Hackens, B
Gence, L
Farhi, G
Faniel, S
Gustin, C
Bayot, V
Wallart, X
Bollaert, S
Cappy, A
Vasallo, B G
Mateos, J
Gonzalez, T
description We report on low temperature (4.2K - 140K) measurements of four-terminal ballistic nano-junctions, etched on a two-dimensional electron gas confined in an InGaAs/InAlAs heterostructure. A symmetry-breaking artificial scatterer is introduced in the center of the junctions. The geometry of the junctions and scatterers is inspired by a recent theoretical work by Fleischmann and Geisel (R. Fleischmann and T. Geisel, Phys. Rev. Lett. 8,016804 (2002)). We measure the voltage V_LU generated between the upper and lower contacts when a current I_SD flows between the left and right contacts. We demonstrate that the shape, the amplitude and even the sign of the nonlinear V_LU(I_SD) characteristic can be tuned by applying voltage biases on side gates and/or illuminating the sample. The origin of this behavior is discussed using comparisons to Monte-Carlo (semiclassical) simulations of our devices.
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title Tunable nonlinear current-voltage characteristic in four-terminal ballistic nano-junctions
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