Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3

We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an i...

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Veröffentlicht in:	Physica. C, Superconductivity Superconductivity, 2006-10, Vol.445-448, p.849-852
Hauptverfasser:	Ota, Y., Sakuma, J., Kimura, Y., Michikami, O.
Format:	Artikel
Sprache:	eng
Schlagworte:	CeO2 Critical current density EuBa2Cu3O7
Online-Zugang:	Volltext
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