Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3
We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an i...
Gespeichert in:
| Veröffentlicht in: | Physica. C, Superconductivity Superconductivity, 2006-10, Vol.445-448, p.849-852 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 852 |
|---|---|
| container_issue | |
| container_start_page | 849 |
| container_title | Physica. C, Superconductivity |
| container_volume | 445-448 |
| creator | Ota, Y. Sakuma, J. Kimura, Y. Michikami, O. |
| description | We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an increase in Doff. The orientation of an EBCO thin film was dependent on Doff of the buffer layer. At Doff=0–30mm, only (00l) peaks of an EBCO thin film were observed by X-ray diffraction patterns. At Doff values over 40mm, (110) or (103) peaks in addition to (00l) peaks were observed. At Doff=30mm, EBCO thin films exhibited critical temperatures (Tce) of approximately 89K and critical current densities (Jc) of 3.5MA/cm2 at 77.3K. |
| doi_str_mv | 10.1016/j.physc.2006.05.039 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29921402</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S092145340600462X</els_id><sourcerecordid>29921402</sourcerecordid><originalsourceid>FETCH-LOGICAL-c400t-23c6d472988dbc49fc1aec3474cafcc8ba72370ad8980c6dc2b947ab9cd20633</originalsourceid><addsrcrecordid>eNp9kE1rGzEQhkVooG7SX9CLTrntRl_2rg45pCZfEDCE3IV2dhTLrKWttNviW3565TjnzGVgeN4X5iHkF2c1Z3x1vavH7SFDLRhb1WxZM6nPyIK3jawEV_IbWTAteKWWUn0nP3LesTJc8wV5f8HBTj6GvPUj7XD6hxhonkdMEEM_w-TDGx1TLIfJY6bR0bv5txXrWW4aOm19oM4P-0xt6EsuOQtI9zGN2zjEt8ORX-NG0G52DhMd7AFTaQn0pbodxEZeknNnh4w_P_cFeb2_e10_Vs-bh6f17XMFirGpEhJWvWqEbtu-A6UdcIsgVaPAOoC2s42QDbN9q1tWUBCdVo3tNPSCraS8IFen2vLKnxnzZPY-Aw6DDRjnbIQughQTBZQnEFLMOaEzY_J7mw6GM3OUbXbmQ7Y5yjZsaYrskro5pbC88NdjMhk8BsDeJ4TJ9NF_mf8PRBGLHQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29921402</pqid></control><display><type>article</type><title>Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3</title><source>Access via ScienceDirect (Elsevier)</source><creator>Ota, Y. ; Sakuma, J. ; Kimura, Y. ; Michikami, O.</creator><creatorcontrib>Ota, Y. ; Sakuma, J. ; Kimura, Y. ; Michikami, O.</creatorcontrib><description>We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an increase in Doff. The orientation of an EBCO thin film was dependent on Doff of the buffer layer. At Doff=0–30mm, only (00l) peaks of an EBCO thin film were observed by X-ray diffraction patterns. At Doff values over 40mm, (110) or (103) peaks in addition to (00l) peaks were observed. At Doff=30mm, EBCO thin films exhibited critical temperatures (Tce) of approximately 89K and critical current densities (Jc) of 3.5MA/cm2 at 77.3K.</description><identifier>ISSN: 0921-4534</identifier><identifier>EISSN: 1873-2143</identifier><identifier>DOI: 10.1016/j.physc.2006.05.039</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>CeO2 ; Critical current density ; EuBa2Cu3O7</subject><ispartof>Physica. C, Superconductivity, 2006-10, Vol.445-448, p.849-852</ispartof><rights>2006 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c400t-23c6d472988dbc49fc1aec3474cafcc8ba72370ad8980c6dc2b947ab9cd20633</citedby><cites>FETCH-LOGICAL-c400t-23c6d472988dbc49fc1aec3474cafcc8ba72370ad8980c6dc2b947ab9cd20633</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.physc.2006.05.039$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Ota, Y.</creatorcontrib><creatorcontrib>Sakuma, J.</creatorcontrib><creatorcontrib>Kimura, Y.</creatorcontrib><creatorcontrib>Michikami, O.</creatorcontrib><title>Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3</title><title>Physica. C, Superconductivity</title><description>We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an increase in Doff. The orientation of an EBCO thin film was dependent on Doff of the buffer layer. At Doff=0–30mm, only (00l) peaks of an EBCO thin film were observed by X-ray diffraction patterns. At Doff values over 40mm, (110) or (103) peaks in addition to (00l) peaks were observed. At Doff=30mm, EBCO thin films exhibited critical temperatures (Tce) of approximately 89K and critical current densities (Jc) of 3.5MA/cm2 at 77.3K.</description><subject>CeO2</subject><subject>Critical current density</subject><subject>EuBa2Cu3O7</subject><issn>0921-4534</issn><issn>1873-2143</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNp9kE1rGzEQhkVooG7SX9CLTrntRl_2rg45pCZfEDCE3IV2dhTLrKWttNviW3565TjnzGVgeN4X5iHkF2c1Z3x1vavH7SFDLRhb1WxZM6nPyIK3jawEV_IbWTAteKWWUn0nP3LesTJc8wV5f8HBTj6GvPUj7XD6hxhonkdMEEM_w-TDGx1TLIfJY6bR0bv5txXrWW4aOm19oM4P-0xt6EsuOQtI9zGN2zjEt8ORX-NG0G52DhMd7AFTaQn0pbodxEZeknNnh4w_P_cFeb2_e10_Vs-bh6f17XMFirGpEhJWvWqEbtu-A6UdcIsgVaPAOoC2s42QDbN9q1tWUBCdVo3tNPSCraS8IFen2vLKnxnzZPY-Aw6DDRjnbIQughQTBZQnEFLMOaEzY_J7mw6GM3OUbXbmQ7Y5yjZsaYrskro5pbC88NdjMhk8BsDeJ4TJ9NF_mf8PRBGLHQ</recordid><startdate>20061001</startdate><enddate>20061001</enddate><creator>Ota, Y.</creator><creator>Sakuma, J.</creator><creator>Kimura, Y.</creator><creator>Michikami, O.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20061001</creationdate><title>Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3</title><author>Ota, Y. ; Sakuma, J. ; Kimura, Y. ; Michikami, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c400t-23c6d472988dbc49fc1aec3474cafcc8ba72370ad8980c6dc2b947ab9cd20633</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>CeO2</topic><topic>Critical current density</topic><topic>EuBa2Cu3O7</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ota, Y.</creatorcontrib><creatorcontrib>Sakuma, J.</creatorcontrib><creatorcontrib>Kimura, Y.</creatorcontrib><creatorcontrib>Michikami, O.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica. C, Superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ota, Y.</au><au>Sakuma, J.</au><au>Kimura, Y.</au><au>Michikami, O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3</atitle><jtitle>Physica. C, Superconductivity</jtitle><date>2006-10-01</date><risdate>2006</risdate><volume>445-448</volume><spage>849</spage><epage>852</epage><pages>849-852</pages><issn>0921-4534</issn><eissn>1873-2143</eissn><abstract>We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an increase in Doff. The orientation of an EBCO thin film was dependent on Doff of the buffer layer. At Doff=0–30mm, only (00l) peaks of an EBCO thin film were observed by X-ray diffraction patterns. At Doff values over 40mm, (110) or (103) peaks in addition to (00l) peaks were observed. At Doff=30mm, EBCO thin films exhibited critical temperatures (Tce) of approximately 89K and critical current densities (Jc) of 3.5MA/cm2 at 77.3K.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.physc.2006.05.039</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0921-4534 |
| ispartof | Physica. C, Superconductivity, 2006-10, Vol.445-448, p.849-852 |
| issn | 0921-4534 1873-2143 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29921402 |
| source | Access via ScienceDirect (Elsevier) |
| subjects | CeO2 Critical current density EuBa2Cu3O7 |
| title | Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3 |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T01%3A16%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Relationship%20between%20superconducting%20properties%20of%20EuBa2Cu3O7%20thin%20films%20and%20surface%20morphology%20of%20CeO2%20buffer%20layers%20on%20R-Al2O3&rft.jtitle=Physica.%20C,%20Superconductivity&rft.au=Ota,%20Y.&rft.date=2006-10-01&rft.volume=445-448&rft.spage=849&rft.epage=852&rft.pages=849-852&rft.issn=0921-4534&rft.eissn=1873-2143&rft_id=info:doi/10.1016/j.physc.2006.05.039&rft_dat=%3Cproquest_cross%3E29921402%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29921402&rft_id=info:pmid/&rft_els_id=S092145340600462X&rfr_iscdi=true |