An exploratory study of the effects of the dielectric-barrier-discharge surface pre-treatment on the self-assembly processes of a (3-Aminopropyl) trimethoxysilane on glass substrates

X-ray photoelectron spectrometry (XPS), Fourier transform infrared spectrometry (FTIR), secondary-ion-mass spectrometry (SIMS) and contact angle measurement have been used in study of the enhancement effect of substrate pre-treatment by dielectric-barrier-discharge (DBD) for the self-assembly of a (...

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Veröffentlicht in:Applied surface science 2007-06, Vol.253 (16), p.6932-6938
Hauptverfasser: CUI, Nai-Yi, CHAOZONG LIU, BROWN, Norman M. D, MEENAN, Brian J
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Sprache:eng
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