Pb electrodeposition on polycrystalline Cu in the presence and absence of Cl −: A combined oblique incidence reflectivity difference and in situ AFM study

Oblique incidence reflectivity difference (OI-RD) measurements reveal differences in the earliest stages of overpotential-deposited (OPD) growth between Pb electrodeposition on polycrystalline Cu surfaces in the presence and absence of Cl −. At moderate overpotentials, when only 100 mM ClO 4 - is pr...

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Veröffentlicht in:	Surface science 2007-04, Vol.601 (8), p.1886-1891
Hauptverfasser:	Wu, Guang Yu, Bae, S.-E., Gewirth, A.A., Gray, J., Zhu, X.D., Moffat, T.P., Schwarzacher, W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Copper Cross-disciplinary physics: materials science rheology Electrochemical methods Electrochemical phenomena Ellipsometry Exact sciences and technology Lead Nucleation Physics
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