Growth and optical properties of epitaxial BexZn1-xO alloy films

BexZn1-xO (0x0.28) alloy films were epitaxially grown by hybrid electron-beam deposition system. The crystal structure of the BexZn1-xO was investigated by X-ray diffraction pattern by varying the Be concentration. The crystal structure of the BexZn1-xO films was hexagonal within the variance of the...

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Veröffentlicht in:Journal of crystal growth 2007-05, Vol.303 (2), p.506-509
Hauptverfasser: HAN, M. S, KIM, J. H, JEONG, T. S, PARKA, J. M, YOUN, C. J, LEEM, J. H, RYU, Y. R
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Sprache:eng
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Zusammenfassung:BexZn1-xO (0x0.28) alloy films were epitaxially grown by hybrid electron-beam deposition system. The crystal structure of the BexZn1-xO was investigated by X-ray diffraction pattern by varying the Be concentration. The crystal structure of the BexZn1-xO films was hexagonal within the variance of the Be component. Also, the phase separation within the BexZn1-xO alloy film was not observed. The photoluminescence emission peak of the BexZn1-xO films revealed the same pattern till the Be mole fraction increase up to x=0.11. When the Be mole fraction is larger than x > 0.11, the Ex(A) of free exciton at 3.624eV was only observed in the BexZn1-xO films. The band gap energy of the BexZn1-xO can be tailored from 3.30eV (x=0) to 4.13eV (x=0.28) by alloying ZnO with BeO. Throughout this band gap tuning, we may open the possibilities for fabricating ZnO-based ultraviolet light emitting diode utilizing the active layer comprised of ZnO/BexZn1-xO quantum well structure.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2006.11.348