In situ visualization of degradation of silicon field emitter tips

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Veröffentlicht in:	IEEJ transactions on electrical and electronic engineering 2007-05, Vol.2 (3), p.ix-x
Hauptverfasser:	Nozawa, Naoyuki, Kakushima, Kuniyuki, Hashiguchi, Gen, Fujita, Hiroyuki
Format:	Artikel
Sprache:	eng
Schlagworte:	degradation field emission micromachining nano tips nanotechnology
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doi_str_mv	10.1002/tee.20166
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source	Wiley Online Library Journals Frontfile Complete
subjects	degradation field emission micromachining nano tips nanotechnology
title	In situ visualization of degradation of silicon field emitter tips
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