Accurate and realistic interfacial scattering using density functional theory in a plane-wave basis

The accelerated development of novel spintronics devices requires understanding of the relevant microscopic phenomena at a level sufficient to distinguish different materials and the impact of defects. We present a new method to compute interfacial scattering amplitudes, which are necessary to deter...

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Veröffentlicht in:	Bulletin of the American Physical Society 2004-03, Vol.49 (1)
Hauptverfasser:	Daykov, I P, Arias, T A
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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