Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0)
The growth and chemical composition of Co on Cu(1 0 0) has been studied by He ion scattering and Auger electron spectroscopy (AES) at different temperatures ( T = 130 K, T = 300 K and T = 410 K). Based on different information depths for electron-induced Cu-MNN and Cu-LMM Auger signals and inner she...
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| Veröffentlicht in: | Surface science 2005-01, Vol.575 (1), p.154-162 |
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| creator | Bernhard, T. Pfandzelter, R. Gruyters, M. Winter, H. |
| description | The growth and chemical composition of Co on Cu(1
0
0) has been studied by He ion scattering and Auger electron spectroscopy (AES) at different temperatures (
T
=
130
K,
T
=
300
K and
T
=
410
K). Based on different information depths for electron-induced Cu-MNN and Cu-LMM Auger signals and inner shell production by grazingly scattered protons restricted to the topmost layer, we have modeled the Auger data in order to obtain quantitative information on the chemical composition of ultrathin intermixed Co–Cu films. We find that intermixing and Cu diffusion is not only important for film growth at elevated temperatures, but also for heterogeneous Co/Cu epitaxy at room temperature. |
| doi_str_mv | 10.1016/j.susc.2004.11.016 |
| format | Article |
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0
0) has been studied by He ion scattering and Auger electron spectroscopy (AES) at different temperatures (
T
=
130
K,
T
=
300
K and
T
=
410
K). Based on different information depths for electron-induced Cu-MNN and Cu-LMM Auger signals and inner shell production by grazingly scattered protons restricted to the topmost layer, we have modeled the Auger data in order to obtain quantitative information on the chemical composition of ultrathin intermixed Co–Cu films. We find that intermixing and Cu diffusion is not only important for film growth at elevated temperatures, but also for heterogeneous Co/Cu epitaxy at room temperature.</description><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>DOI: 10.1016/j.susc.2004.11.016</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Auger electron spectroscopy ; Cobalt ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Copper ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Ion–solid interactions ; Metal–metal interfaces ; Molecular beam epitaxy ; Physics ; Surface segregation</subject><ispartof>Surface science, 2005-01, Vol.575 (1), p.154-162</ispartof><rights>2004 Elsevier B.V.</rights><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c392t-748c54df65c6973fe0c3522d5fab09977c83f26ff516d77393168405be6608d63</citedby><cites>FETCH-LOGICAL-c392t-748c54df65c6973fe0c3522d5fab09977c83f26ff516d77393168405be6608d63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0039602804014669$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16449252$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Bernhard, T.</creatorcontrib><creatorcontrib>Pfandzelter, R.</creatorcontrib><creatorcontrib>Gruyters, M.</creatorcontrib><creatorcontrib>Winter, H.</creatorcontrib><title>Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0)</title><title>Surface science</title><description>The growth and chemical composition of Co on Cu(1
0
0) has been studied by He ion scattering and Auger electron spectroscopy (AES) at different temperatures (
T
=
130
K,
T
=
300
K and
T
=
410
K). Based on different information depths for electron-induced Cu-MNN and Cu-LMM Auger signals and inner shell production by grazingly scattered protons restricted to the topmost layer, we have modeled the Auger data in order to obtain quantitative information on the chemical composition of ultrathin intermixed Co–Cu films. We find that intermixing and Cu diffusion is not only important for film growth at elevated temperatures, but also for heterogeneous Co/Cu epitaxy at room temperature.</description><subject>Auger electron spectroscopy</subject><subject>Cobalt</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Copper</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Ion–solid interactions</subject><subject>Metal–metal interfaces</subject><subject>Molecular beam epitaxy</subject><subject>Physics</subject><subject>Surface segregation</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqFkEtLJDEURoM4YOvMH3CVjaKLqsmj8gI30vikYTbOOpSpG01TlWqTKp3596ZpwZ3ezYWPc78LB6FjSmpKqPy9rvOcXc0IaWpK6xLtoQXVylRMCb2PFoRwU0nC9AE6zHlNyjRGLND9AwwbSO00J6g62EDsIE44xAnSEP6F-IRHj-d-KshziHg5Yh_6IeOnNL5FPJZkPqOYYHL-E_3wbZ_h18c-Qn-vrx6Wt9Xqz83d8nJVOW7YVKlGO9F0XgonjeIeiOOCsU749pEYo5TT3DPpvaCyU4obTqVuiHgEKYnuJD9Cp7veTRpfZsiTHUJ20PdthHHOlpUOzQz_HtSSK0FNAdkOdGnMOYG3mxSGNv23lNitX7u2W79269dSaktUjk4-2tvs2t6nNrqQPy9l0xgmWOEudhwUJ68Bks0uQHTQhQRust0YvnrzDvyjjtE</recordid><startdate>20050120</startdate><enddate>20050120</enddate><creator>Bernhard, T.</creator><creator>Pfandzelter, R.</creator><creator>Gruyters, M.</creator><creator>Winter, H.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8G</scope><scope>JG9</scope><scope>L7M</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>20050120</creationdate><title>Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0)</title><author>Bernhard, T. ; Pfandzelter, R. ; Gruyters, M. ; Winter, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c392t-748c54df65c6973fe0c3522d5fab09977c83f26ff516d77393168405be6608d63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Auger electron spectroscopy</topic><topic>Cobalt</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Copper</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Ion–solid interactions</topic><topic>Metal–metal interfaces</topic><topic>Molecular beam epitaxy</topic><topic>Physics</topic><topic>Surface segregation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bernhard, T.</creatorcontrib><creatorcontrib>Pfandzelter, R.</creatorcontrib><creatorcontrib>Gruyters, M.</creatorcontrib><creatorcontrib>Winter, H.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bernhard, T.</au><au>Pfandzelter, R.</au><au>Gruyters, M.</au><au>Winter, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0)</atitle><jtitle>Surface science</jtitle><date>2005-01-20</date><risdate>2005</risdate><volume>575</volume><issue>1</issue><spage>154</spage><epage>162</epage><pages>154-162</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><abstract>The growth and chemical composition of Co on Cu(1
0
0) has been studied by He ion scattering and Auger electron spectroscopy (AES) at different temperatures (
T
=
130
K,
T
=
300
K and
T
=
410
K). Based on different information depths for electron-induced Cu-MNN and Cu-LMM Auger signals and inner shell production by grazingly scattered protons restricted to the topmost layer, we have modeled the Auger data in order to obtain quantitative information on the chemical composition of ultrathin intermixed Co–Cu films. We find that intermixing and Cu diffusion is not only important for film growth at elevated temperatures, but also for heterogeneous Co/Cu epitaxy at room temperature.</abstract><cop>Lausanne</cop><cop>Amsterdam</cop><cop>New York, NY</cop><pub>Elsevier B.V</pub><doi>10.1016/j.susc.2004.11.016</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0039-6028 |
| ispartof | Surface science, 2005-01, Vol.575 (1), p.154-162 |
| issn | 0039-6028 1879-2758 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29778293 |
| source | Elsevier ScienceDirect Journals |
| subjects | Auger electron spectroscopy Cobalt Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Copper Cross-disciplinary physics: materials science rheology Exact sciences and technology Ion–solid interactions Metal–metal interfaces Molecular beam epitaxy Physics Surface segregation |
| title | Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0) |
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