$X-ray diffraction imaging self-detected with a CCD$

X-ray diffraction imaging self-detected with a CCD

Self-detection of x-ray diffraction has been accomplished by measuring the electrical behaviour of a semiconductor single-crystal of a commercial detector when it is in and out of the x-ray diffraction condition. A decrease in the photocurrent or in the photocounting is measured when the detector is...

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Veröffentlicht in:	Journal of physics. D, Applied physics Applied physics, 2005-05, Vol.38 (10A), p.A73-A77
Hauptverfasser:	Hönnicke, M G, Cusatis, C
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering
Online-Zugang:	Volltext
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