The TJI-1MH Thickness Meter for Galvanic Coatings

The specifics for monitoring the thickness of electrically-conductive coatings on a conductive substrate are described. Difficulties involved in designing thickness meters that assist in this task are noted. The technical characteristics and design of a TJI-1MII versatile eddy-current sensor are pre...

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Veröffentlicht in:	Russian journal of nondestructive testing 2004-06, Vol.40 (6), p.418-421
Hauptverfasser:	Bakunov, A S, Kaloshin, V A, Rudakov, A S, Shubochkin, S E
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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