Radiative defluorination of poly (vinylidene fluoride) under soft X-ray radiation
The rates of poly (vinylidene fluoride) (PVDF) degradation under synchrotron (SR) and conventional X-ray radiation have been measured and compared. NEXAFS spectra of fluorine show significant changes in their shape and intensity with elevation of radiation dose (or duration of SR exposure). Non-mono...
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| Veröffentlicht in: | Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2006-11, Vol.75 (11), p.2024-2028 |
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| container_title | Radiation physics and chemistry (Oxford, England : 1993) |
| container_volume | 75 |
| creator | Chebotaryov, S.S. Baitinger, E.M. Volegov, A.A. Margamov, I.G. Gribov, I.V. Moskvina, N.A. Kuznetsov, V.L. Evsyukov, S.E. Pesin, L.A. |
| description | The rates of poly (vinylidene fluoride) (PVDF) degradation under synchrotron (SR) and conventional X-ray radiation have been measured and compared. NEXAFS spectra of fluorine show significant changes in their shape and intensity with elevation of radiation dose (or duration of SR exposure). Non-monochromatic AlK
α radiation and the flow of secondary electrons accompanying it also cause surface degradation of PVDF. XPS allows one to measure relative content of fluorine by three ways: via relative intensities of F2s/C1s, F1s/C1s, spectra and using the features arising due to of C1s peaks in CF
2 and CF groups. |
| doi_str_mv | 10.1016/j.radphyschem.2005.12.051 |
| format | Article |
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α radiation and the flow of secondary electrons accompanying it also cause surface degradation of PVDF. XPS allows one to measure relative content of fluorine by three ways: via relative intensities of F2s/C1s, F1s/C1s, spectra and using the features arising due to of C1s peaks in CF
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α radiation and the flow of secondary electrons accompanying it also cause surface degradation of PVDF. XPS allows one to measure relative content of fluorine by three ways: via relative intensities of F2s/C1s, F1s/C1s, spectra and using the features arising due to of C1s peaks in CF
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α radiation and the flow of secondary electrons accompanying it also cause surface degradation of PVDF. XPS allows one to measure relative content of fluorine by three ways: via relative intensities of F2s/C1s, F1s/C1s, spectra and using the features arising due to of C1s peaks in CF
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| identifier | ISSN: 0969-806X |
| ispartof | Radiation physics and chemistry (Oxford, England : 1993), 2006-11, Vol.75 (11), p.2024-2028 |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Dehydrofluorination NEXAFS PVDF XPS |
| title | Radiative defluorination of poly (vinylidene fluoride) under soft X-ray radiation |
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