Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery
Reliability of RAM memory systems is impaired by environmental disturbances, causing soft errors, whereby one data bit is transformed to another bit. Single-error correcting codes with memory scrubbing offer the most effective method to recover from such errors. This paper analyzes the reliability a...
Gespeichert in:
Veröffentlicht in: | The International journal of quality & reliability management 2003-07, Vol.20 (5), p.620-636 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 636 |
---|---|
container_issue | 5 |
container_start_page | 620 |
container_title | The International journal of quality & reliability management |
container_volume | 20 |
creator | Kontoleon, John M Andrianakis, John |
description | Reliability of RAM memory systems is impaired by environmental disturbances, causing soft errors, whereby one data bit is transformed to another bit. Single-error correcting codes with memory scrubbing offer the most effective method to recover from such errors. This paper analyzes the reliability and determines the MTTF for simplex and duplex memory systems with single-error correction and or soft-error scrubbing recovery. It extends previous work on the deterministic scrubbing recovery of simplex memory systems by using a more general model that takes into account cancelling soft errors. In the duplex memory system an additional level of static redundancy is proposed by employing a decoding algorithm at the memory module level. The reliability analysis of the duplex system with soft-error scrubbing takes into account the decoder output which upon scrubbing transforms words with a number of multiple errors to words with a different number of errors. Computer results show that this combination of data and system redundancy provides more reliability than either data or system redundancy alone. |
doi_str_mv | 10.1108/02656710310476561 |
format | Article |
fullrecord | <record><control><sourceid>proquest_emera</sourceid><recordid>TN_cdi_proquest_miscellaneous_29578308</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29578308</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-93d67b38b0860f72097ca9fef8ec00ec680fd3343feb7ea3a66240e955e27df73</originalsourceid><addsrcrecordid>eNqN0U1LxDAQBuAgCq6rP8Bb8KAerE6aNkmPsvgFguAHeCtpO9FIu1mTVu2_N7qeVMRThszzzmGGkG0Gh4yBOoJU5EIy4AwyGUu2QiZM5ioRQqWrZPLRTyK4XycbITwBQMpYOiHNNbZWV7a1_Uj1XLdjsIE6Q4PtFi2-xb-GNsNn2WHn_EjDGHrsAn21_SO9OZl9kuBMn6D3ztNQ-6Gq7PyBeqzdC_pxk6wZ3Qbc-nqn5O705HZ2nlxenV3Mji-TmgvWJwVvhKy4qkAJMDKFQta6MGgU1gBYCwWm4TzjBiuJmmsh0gywyHNMZWMkn5K95dyFd88Dhr7sbKixbfUc3RBKmfGMCSlZlLt_yrTIpeKgItz_E7IcBJecqzzSnW_0yQ0-rjSqQgrgMtIpYUtUexeCR1MuvO20H0sG5cclyx-XjBlYZrBDr9vmX5GD3yM_aLloDH8HwHisFA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>197603706</pqid></control><display><type>article</type><title>Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery</title><source>Emerald Journals</source><creator>Kontoleon, John M ; Andrianakis, John</creator><creatorcontrib>Kontoleon, John M ; Andrianakis, John</creatorcontrib><description>Reliability of RAM memory systems is impaired by environmental disturbances, causing soft errors, whereby one data bit is transformed to another bit. Single-error correcting codes with memory scrubbing offer the most effective method to recover from such errors. This paper analyzes the reliability and determines the MTTF for simplex and duplex memory systems with single-error correction and or soft-error scrubbing recovery. It extends previous work on the deterministic scrubbing recovery of simplex memory systems by using a more general model that takes into account cancelling soft errors. In the duplex memory system an additional level of static redundancy is proposed by employing a decoding algorithm at the memory module level. The reliability analysis of the duplex system with soft-error scrubbing takes into account the decoder output which upon scrubbing transforms words with a number of multiple errors to words with a different number of errors. Computer results show that this combination of data and system redundancy provides more reliability than either data or system redundancy alone.</description><identifier>ISSN: 0265-671X</identifier><identifier>EISSN: 1758-6682</identifier><identifier>DOI: 10.1108/02656710310476561</identifier><language>eng</language><publisher>Bradford: MCB UP Ltd</publisher><subject>Computers ; Decoding ; Error correction & detection ; Fault tolerance ; Hierarchies ; Mathematical models ; Quality control ; Random access memory ; Reliability ; Studies ; Systems analysis</subject><ispartof>The International journal of quality & reliability management, 2003-07, Vol.20 (5), p.620-636</ispartof><rights>MCB UP Limited</rights><rights>Copyright MCB UP Limited (MCB) 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-93d67b38b0860f72097ca9fef8ec00ec680fd3343feb7ea3a66240e955e27df73</citedby><cites>FETCH-LOGICAL-c361t-93d67b38b0860f72097ca9fef8ec00ec680fd3343feb7ea3a66240e955e27df73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/02656710310476561/full/pdf$$EPDF$$P50$$Gemerald$$H</linktopdf><linktohtml>$$Uhttps://www.emerald.com/insight/content/doi/10.1108/02656710310476561/full/html$$EHTML$$P50$$Gemerald$$H</linktohtml><link.rule.ids>314,776,780,961,11614,27901,27902,52661,52664</link.rule.ids></links><search><creatorcontrib>Kontoleon, John M</creatorcontrib><creatorcontrib>Andrianakis, John</creatorcontrib><title>Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery</title><title>The International journal of quality & reliability management</title><description>Reliability of RAM memory systems is impaired by environmental disturbances, causing soft errors, whereby one data bit is transformed to another bit. Single-error correcting codes with memory scrubbing offer the most effective method to recover from such errors. This paper analyzes the reliability and determines the MTTF for simplex and duplex memory systems with single-error correction and or soft-error scrubbing recovery. It extends previous work on the deterministic scrubbing recovery of simplex memory systems by using a more general model that takes into account cancelling soft errors. In the duplex memory system an additional level of static redundancy is proposed by employing a decoding algorithm at the memory module level. The reliability analysis of the duplex system with soft-error scrubbing takes into account the decoder output which upon scrubbing transforms words with a number of multiple errors to words with a different number of errors. Computer results show that this combination of data and system redundancy provides more reliability than either data or system redundancy alone.</description><subject>Computers</subject><subject>Decoding</subject><subject>Error correction & detection</subject><subject>Fault tolerance</subject><subject>Hierarchies</subject><subject>Mathematical models</subject><subject>Quality control</subject><subject>Random access memory</subject><subject>Reliability</subject><subject>Studies</subject><subject>Systems analysis</subject><issn>0265-671X</issn><issn>1758-6682</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNqN0U1LxDAQBuAgCq6rP8Bb8KAerE6aNkmPsvgFguAHeCtpO9FIu1mTVu2_N7qeVMRThszzzmGGkG0Gh4yBOoJU5EIy4AwyGUu2QiZM5ioRQqWrZPLRTyK4XycbITwBQMpYOiHNNbZWV7a1_Uj1XLdjsIE6Q4PtFi2-xb-GNsNn2WHn_EjDGHrsAn21_SO9OZl9kuBMn6D3ztNQ-6Gq7PyBeqzdC_pxk6wZ3Qbc-nqn5O705HZ2nlxenV3Mji-TmgvWJwVvhKy4qkAJMDKFQta6MGgU1gBYCwWm4TzjBiuJmmsh0gywyHNMZWMkn5K95dyFd88Dhr7sbKixbfUc3RBKmfGMCSlZlLt_yrTIpeKgItz_E7IcBJecqzzSnW_0yQ0-rjSqQgrgMtIpYUtUexeCR1MuvO20H0sG5cclyx-XjBlYZrBDr9vmX5GD3yM_aLloDH8HwHisFA</recordid><startdate>20030701</startdate><enddate>20030701</enddate><creator>Kontoleon, John M</creator><creator>Andrianakis, John</creator><general>MCB UP Ltd</general><general>Emerald Group Publishing Limited</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TA</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>8AO</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FI</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>F~G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K6~</scope><scope>K8~</scope><scope>L.-</scope><scope>L6V</scope><scope>M0C</scope><scope>M0T</scope><scope>M2T</scope><scope>M7S</scope><scope>PQBIZ</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>20030701</creationdate><title>Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery</title><author>Kontoleon, John M ; Andrianakis, John</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-93d67b38b0860f72097ca9fef8ec00ec680fd3343feb7ea3a66240e955e27df73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Computers</topic><topic>Decoding</topic><topic>Error correction & detection</topic><topic>Fault tolerance</topic><topic>Hierarchies</topic><topic>Mathematical models</topic><topic>Quality control</topic><topic>Random access memory</topic><topic>Reliability</topic><topic>Studies</topic><topic>Systems analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kontoleon, John M</creatorcontrib><creatorcontrib>Andrianakis, John</creatorcontrib><collection>CrossRef</collection><collection>Materials Business File</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ProQuest Pharma Collection</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Hospital Premium Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Health Research Premium Collection</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Business Collection</collection><collection>DELNET Management Collection</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Global</collection><collection>Healthcare Administration Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>ProQuest One Business</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>The International journal of quality & reliability management</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kontoleon, John M</au><au>Andrianakis, John</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery</atitle><jtitle>The International journal of quality & reliability management</jtitle><date>2003-07-01</date><risdate>2003</risdate><volume>20</volume><issue>5</issue><spage>620</spage><epage>636</epage><pages>620-636</pages><issn>0265-671X</issn><eissn>1758-6682</eissn><abstract>Reliability of RAM memory systems is impaired by environmental disturbances, causing soft errors, whereby one data bit is transformed to another bit. Single-error correcting codes with memory scrubbing offer the most effective method to recover from such errors. This paper analyzes the reliability and determines the MTTF for simplex and duplex memory systems with single-error correction and or soft-error scrubbing recovery. It extends previous work on the deterministic scrubbing recovery of simplex memory systems by using a more general model that takes into account cancelling soft errors. In the duplex memory system an additional level of static redundancy is proposed by employing a decoding algorithm at the memory module level. The reliability analysis of the duplex system with soft-error scrubbing takes into account the decoder output which upon scrubbing transforms words with a number of multiple errors to words with a different number of errors. Computer results show that this combination of data and system redundancy provides more reliability than either data or system redundancy alone.</abstract><cop>Bradford</cop><pub>MCB UP Ltd</pub><doi>10.1108/02656710310476561</doi><tpages>17</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0265-671X |
ispartof | The International journal of quality & reliability management, 2003-07, Vol.20 (5), p.620-636 |
issn | 0265-671X 1758-6682 |
language | eng |
recordid | cdi_proquest_miscellaneous_29578308 |
source | Emerald Journals |
subjects | Computers Decoding Error correction & detection Fault tolerance Hierarchies Mathematical models Quality control Random access memory Reliability Studies Systems analysis |
title | Reliability analysis of simplex and duplex memory systems with SEC and soft-error scrubbing recovery |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T16%3A52%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_emera&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reliability%20analysis%20of%20simplex%20and%20duplex%20memory%20systems%20with%20SEC%20and%20soft-error%20scrubbing%20recovery&rft.jtitle=The%20International%20journal%20of%20quality%20&%20reliability%20management&rft.au=Kontoleon,%20John%20M&rft.date=2003-07-01&rft.volume=20&rft.issue=5&rft.spage=620&rft.epage=636&rft.pages=620-636&rft.issn=0265-671X&rft.eissn=1758-6682&rft_id=info:doi/10.1108/02656710310476561&rft_dat=%3Cproquest_emera%3E29578308%3C/proquest_emera%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=197603706&rft_id=info:pmid/&rfr_iscdi=true |