The effect of thickness on the composition of passive films on a Ti–50Zr at% alloy
Anodic films were grown potentiodynamically in different electrolytes (pH = 1–14) on a Ti–50Zr at% cast alloy, obtained by fusion in a voltaic arc under argon atmosphere. The thickness of the films was varied by changing formation potential from the open circuit potential up to about 9 V; growth was...
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| Veröffentlicht in: | Electrochimica acta 2006-04, Vol.51 (17), p.3506-3515 |
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| container_title | Electrochimica acta |
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| creator | Oliveira, N.T.C. Biaggio, S.R. Nascente, P.A.P. Piazza, S. Sunseri, C. Di Quarto, F. |
| description | Anodic films were grown potentiodynamically in different electrolytes (pH
=
1–14) on a Ti–50Zr at% cast alloy, obtained by fusion in a voltaic arc under argon atmosphere. The thickness of the films was varied by changing formation potential from the open circuit potential up to about 9
V; growth was followed by 30
min stabilization at the forming potential. Films having different thicknesses were characterized by photocurrent spectroscopy (PCS) and electrochemical impedance spectroscopy (EIS). Moreover, film composition was analyzed by X-ray photoelectron spectroscopy (XPS).
Regardless of the anodizing conditions, passive films on the Ti–50Zr at% alloy consist of a single layer mixed oxide phase containing both TiO
2 and ZrO
2 groups. However, an enrichment of Ti within the passive film, increasing with the film thickness, is detected both by PCS and XPS. This leads to concentration profiles of Ti
4+ and Zr
4+ ions along the thickness, and to different electronic properties of very thin films (more insulating) with respect to thicker films (more semiconducting), as revealed by the photocurrent–potential curves. |
| doi_str_mv | 10.1016/j.electacta.2005.10.007 |
| format | Article |
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=
1–14) on a Ti–50Zr at% cast alloy, obtained by fusion in a voltaic arc under argon atmosphere. The thickness of the films was varied by changing formation potential from the open circuit potential up to about 9
V; growth was followed by 30
min stabilization at the forming potential. Films having different thicknesses were characterized by photocurrent spectroscopy (PCS) and electrochemical impedance spectroscopy (EIS). Moreover, film composition was analyzed by X-ray photoelectron spectroscopy (XPS).
Regardless of the anodizing conditions, passive films on the Ti–50Zr at% alloy consist of a single layer mixed oxide phase containing both TiO
2 and ZrO
2 groups. However, an enrichment of Ti within the passive film, increasing with the film thickness, is detected both by PCS and XPS. This leads to concentration profiles of Ti
4+ and Zr
4+ ions along the thickness, and to different electronic properties of very thin films (more insulating) with respect to thicker films (more semiconducting), as revealed by the photocurrent–potential curves.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2005.10.007</identifier><identifier>CODEN: ELCAAV</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Corrosion ; Corrosion mechanisms ; Exact sciences and technology ; Metals. Metallurgy ; Passive films ; Photocurrent spectroscopy ; Titanium alloys ; X-ray photoelectron spectroscopy</subject><ispartof>Electrochimica acta, 2006-04, Vol.51 (17), p.3506-3515</ispartof><rights>2005 Elsevier Ltd</rights><rights>2006 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c376t-979cbab77b120504073c537e0ae1fb8d5bcc2313121899156c9ee5ad68fdcab23</citedby><cites>FETCH-LOGICAL-c376t-979cbab77b120504073c537e0ae1fb8d5bcc2313121899156c9ee5ad68fdcab23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.electacta.2005.10.007$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,782,786,3552,27931,27932,46002</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17712668$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Oliveira, N.T.C.</creatorcontrib><creatorcontrib>Biaggio, S.R.</creatorcontrib><creatorcontrib>Nascente, P.A.P.</creatorcontrib><creatorcontrib>Piazza, S.</creatorcontrib><creatorcontrib>Sunseri, C.</creatorcontrib><creatorcontrib>Di Quarto, F.</creatorcontrib><title>The effect of thickness on the composition of passive films on a Ti–50Zr at% alloy</title><title>Electrochimica acta</title><description>Anodic films were grown potentiodynamically in different electrolytes (pH
=
1–14) on a Ti–50Zr at% cast alloy, obtained by fusion in a voltaic arc under argon atmosphere. The thickness of the films was varied by changing formation potential from the open circuit potential up to about 9
V; growth was followed by 30
min stabilization at the forming potential. Films having different thicknesses were characterized by photocurrent spectroscopy (PCS) and electrochemical impedance spectroscopy (EIS). Moreover, film composition was analyzed by X-ray photoelectron spectroscopy (XPS).
Regardless of the anodizing conditions, passive films on the Ti–50Zr at% alloy consist of a single layer mixed oxide phase containing both TiO
2 and ZrO
2 groups. However, an enrichment of Ti within the passive film, increasing with the film thickness, is detected both by PCS and XPS. This leads to concentration profiles of Ti
4+ and Zr
4+ ions along the thickness, and to different electronic properties of very thin films (more insulating) with respect to thicker films (more semiconducting), as revealed by the photocurrent–potential curves.</description><subject>Applied sciences</subject><subject>Corrosion</subject><subject>Corrosion mechanisms</subject><subject>Exact sciences and technology</subject><subject>Metals. Metallurgy</subject><subject>Passive films</subject><subject>Photocurrent spectroscopy</subject><subject>Titanium alloys</subject><subject>X-ray photoelectron spectroscopy</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFkM9KAzEQxoMoWKvPYC562zrZNMnuUcR_UPBSL15CNjvB1O2mJtuCN9_BN_RJTK3oURgYJvOb7yMfIacMJgyYvFhMsEM7mFyTEkDk1wmA2iMjVile8ErU-2QEwHgxlZU8JEcpLSATUsGIzOfPSNG5rECDo8Ozty89pkRDnwekNixXIfnB5znvVyYlv0HqfLf8Zgyd-8_3DwFPkZrhjJquC2_H5MCZLuHJTx-Tx5vr-dVdMXu4vb-6nBWWKzkUtaptYxqlGlaCgCkobgVXCAaZa6pWNNaWnHFWsqqumZC2RhSmlZVrrWlKPibnO91VDK9rTINe-mSx60yPYZ10WQspqylkUO1AG0NKEZ1eRb808U0z0NsU9UL_pqi3KW4XOaN8efZjYZI1nYumtz79nSvFyuyRucsdh_m_G49RJ-uxt9j6mHV1G_y_Xl9mNoya</recordid><startdate>20060425</startdate><enddate>20060425</enddate><creator>Oliveira, N.T.C.</creator><creator>Biaggio, S.R.</creator><creator>Nascente, P.A.P.</creator><creator>Piazza, S.</creator><creator>Sunseri, C.</creator><creator>Di Quarto, F.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20060425</creationdate><title>The effect of thickness on the composition of passive films on a Ti–50Zr at% alloy</title><author>Oliveira, N.T.C. ; Biaggio, S.R. ; Nascente, P.A.P. ; Piazza, S. ; Sunseri, C. ; Di Quarto, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c376t-979cbab77b120504073c537e0ae1fb8d5bcc2313121899156c9ee5ad68fdcab23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Corrosion</topic><topic>Corrosion mechanisms</topic><topic>Exact sciences and technology</topic><topic>Metals. Metallurgy</topic><topic>Passive films</topic><topic>Photocurrent spectroscopy</topic><topic>Titanium alloys</topic><topic>X-ray photoelectron spectroscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oliveira, N.T.C.</creatorcontrib><creatorcontrib>Biaggio, S.R.</creatorcontrib><creatorcontrib>Nascente, P.A.P.</creatorcontrib><creatorcontrib>Piazza, S.</creatorcontrib><creatorcontrib>Sunseri, C.</creatorcontrib><creatorcontrib>Di Quarto, F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oliveira, N.T.C.</au><au>Biaggio, S.R.</au><au>Nascente, P.A.P.</au><au>Piazza, S.</au><au>Sunseri, C.</au><au>Di Quarto, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of thickness on the composition of passive films on a Ti–50Zr at% alloy</atitle><jtitle>Electrochimica acta</jtitle><date>2006-04-25</date><risdate>2006</risdate><volume>51</volume><issue>17</issue><spage>3506</spage><epage>3515</epage><pages>3506-3515</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><coden>ELCAAV</coden><abstract>Anodic films were grown potentiodynamically in different electrolytes (pH
=
1–14) on a Ti–50Zr at% cast alloy, obtained by fusion in a voltaic arc under argon atmosphere. The thickness of the films was varied by changing formation potential from the open circuit potential up to about 9
V; growth was followed by 30
min stabilization at the forming potential. Films having different thicknesses were characterized by photocurrent spectroscopy (PCS) and electrochemical impedance spectroscopy (EIS). Moreover, film composition was analyzed by X-ray photoelectron spectroscopy (XPS).
Regardless of the anodizing conditions, passive films on the Ti–50Zr at% alloy consist of a single layer mixed oxide phase containing both TiO
2 and ZrO
2 groups. However, an enrichment of Ti within the passive film, increasing with the film thickness, is detected both by PCS and XPS. This leads to concentration profiles of Ti
4+ and Zr
4+ ions along the thickness, and to different electronic properties of very thin films (more insulating) with respect to thicker films (more semiconducting), as revealed by the photocurrent–potential curves.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.electacta.2005.10.007</doi><tpages>10</tpages></addata></record> |
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| identifier | ISSN: 0013-4686 |
| ispartof | Electrochimica acta, 2006-04, Vol.51 (17), p.3506-3515 |
| issn | 0013-4686 1873-3859 |
| language | eng |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Applied sciences Corrosion Corrosion mechanisms Exact sciences and technology Metals. Metallurgy Passive films Photocurrent spectroscopy Titanium alloys X-ray photoelectron spectroscopy |
| title | The effect of thickness on the composition of passive films on a Ti–50Zr at% alloy |
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