Prospects for the fabrication of low aspect ratio coated conductors by inclined substrate deposition
Inclined substrate deposition (ISD) is an effective method for the fast production of highly textured template films for YBa2Cu3Ox (YBCO) coated conductors (CCs). By electron-beam evaporation of MgO targets, we deposited biaxially textured ISD-MgO films with -scan full-width at half maximum (FWHM) o...
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Veröffentlicht in: | Superconductor science & technology 2006-06, Vol.19 (6), p.497-502, Article 497 |
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description | Inclined substrate deposition (ISD) is an effective method for the fast production of highly textured template films for YBa2Cu3Ox (YBCO) coated conductors (CCs). By electron-beam evaporation of MgO targets, we deposited biaxially textured ISD-MgO films with -scan full-width at half maximum (FWHM) of 10 deg on flat metallic tapes. Cube-on-cube epitaxial growth was demonstrated for YBCO grown on ISD-MgO buffered metallic tapes with an SrRuO3 buffer. A transport critical current density of Jc > 1.6 X 106 A cm-2 was measured at 77 K in self-field on short-length flat-tape CCs produced with the ISD architecture. We have grown biaxially textured ISD-MgO template films on round wire surfaces. An in-plane FWHM of 18 deg was measured on ISD-MgO deposited on cylindrical surfaces. CC wires with a low aspect ratio and, therefore, low AC losses, are highly desirable in order to facilitate cable winding without compromising the mechanical integrity or engineering current density of the CCs. This work discusses the prospects of using the ISD process to produce low aspect ratio round-wire CCs. |
doi_str_mv | 10.1088/0953-2048/19/6/015 |
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By electron-beam evaporation of MgO targets, we deposited biaxially textured ISD-MgO films with -scan full-width at half maximum (FWHM) of 10 deg on flat metallic tapes. Cube-on-cube epitaxial growth was demonstrated for YBCO grown on ISD-MgO buffered metallic tapes with an SrRuO3 buffer. A transport critical current density of Jc > 1.6 X 106 A cm-2 was measured at 77 K in self-field on short-length flat-tape CCs produced with the ISD architecture. We have grown biaxially textured ISD-MgO template films on round wire surfaces. An in-plane FWHM of 18 deg was measured on ISD-MgO deposited on cylindrical surfaces. CC wires with a low aspect ratio and, therefore, low AC losses, are highly desirable in order to facilitate cable winding without compromising the mechanical integrity or engineering current density of the CCs. 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By electron-beam evaporation of MgO targets, we deposited biaxially textured ISD-MgO films with -scan full-width at half maximum (FWHM) of 10 deg on flat metallic tapes. Cube-on-cube epitaxial growth was demonstrated for YBCO grown on ISD-MgO buffered metallic tapes with an SrRuO3 buffer. A transport critical current density of Jc > 1.6 X 106 A cm-2 was measured at 77 K in self-field on short-length flat-tape CCs produced with the ISD architecture. We have grown biaxially textured ISD-MgO template films on round wire surfaces. An in-plane FWHM of 18 deg was measured on ISD-MgO deposited on cylindrical surfaces. CC wires with a low aspect ratio and, therefore, low AC losses, are highly desirable in order to facilitate cable winding without compromising the mechanical integrity or engineering current density of the CCs. 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By electron-beam evaporation of MgO targets, we deposited biaxially textured ISD-MgO films with -scan full-width at half maximum (FWHM) of 10 deg on flat metallic tapes. Cube-on-cube epitaxial growth was demonstrated for YBCO grown on ISD-MgO buffered metallic tapes with an SrRuO3 buffer. A transport critical current density of Jc > 1.6 X 106 A cm-2 was measured at 77 K in self-field on short-length flat-tape CCs produced with the ISD architecture. We have grown biaxially textured ISD-MgO template films on round wire surfaces. An in-plane FWHM of 18 deg was measured on ISD-MgO deposited on cylindrical surfaces. CC wires with a low aspect ratio and, therefore, low AC losses, are highly desirable in order to facilitate cable winding without compromising the mechanical integrity or engineering current density of the CCs. 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title | Prospects for the fabrication of low aspect ratio coated conductors by inclined substrate deposition |
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