Study of silicon–organic interfaces by admittance spectroscopy

An admittance spectroscopy technique has been developed for the interfaces between organic monolayers and silicon. The present work involves the development of an effective equivalent circuit to represent the silicon/organic-monolayer system, and the development of a parameter extraction procedure,...

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Veröffentlicht in:	Applied surface science 2006-03, Vol.252 (11), p.3961-3967
1. Verfasser:	Kar, Samares
Format:	Artikel
Sprache:	eng
Schlagworte:	Admittance spectroscopy Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Organic monolayers Physics Self-assembly Silicon–organic interface
Online-Zugang:	Volltext
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