Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications
Nanocrystalline nickel ferrite and zinc doped nickel ferrite thin films with general composition Ni 1− x Zn x Fe 2O 4; x=0.0, 0.2 and 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This method resulted...
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creator | Gupta, Nutan Verma, A. Kashyap, Subhash C. Dube, D.C. |
description | Nanocrystalline nickel ferrite and zinc doped nickel ferrite thin films with general composition Ni
1−
x
Zn
x
Fe
2O
4;
x=0.0, 0.2 and 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This method resulted in single phase, transparent, homogeneous and crack-free nanocrystalline ferrite thin films at annealing temperature as low as 400
°C. The substrates used for film deposition were ITO-coated 7059 glass, fused quartz and Si (1
0
0). The thickness of films was found to be in the range ∼1000–5500
Å. The surface microstructure and morphology investigated by atomic force microscopy (AFM) confirmed the grain size of nickel–zinc ferrite films to be in nanometer range indicating nanocrystalline nature of the films. Dielectric properties such as the real (∈′) and imaginary parts (∈″) of complex permittivity were measured in the X-band microwave frequency region (8–12
GHz) by employing extended cavity perturbation technique. The
M–
H hysteresis measurements on the films annealed at 650
°C revealed narrow hysteresis curves with
H
c and
M
s varying for different compositions. |
doi_str_mv | 10.1016/j.jmmm.2006.05.015 |
format | Article |
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1−
x
Zn
x
Fe
2O
4;
x=0.0, 0.2 and 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This method resulted in single phase, transparent, homogeneous and crack-free nanocrystalline ferrite thin films at annealing temperature as low as 400
°C. The substrates used for film deposition were ITO-coated 7059 glass, fused quartz and Si (1
0
0). The thickness of films was found to be in the range ∼1000–5500
Å. The surface microstructure and morphology investigated by atomic force microscopy (AFM) confirmed the grain size of nickel–zinc ferrite films to be in nanometer range indicating nanocrystalline nature of the films. Dielectric properties such as the real (∈′) and imaginary parts (∈″) of complex permittivity were measured in the X-band microwave frequency region (8–12
GHz) by employing extended cavity perturbation technique. The
M–
H hysteresis measurements on the films annealed at 650
°C revealed narrow hysteresis curves with
H
c and
M
s varying for different compositions.</description><identifier>ISSN: 0304-8853</identifier><identifier>DOI: 10.1016/j.jmmm.2006.05.015</identifier><identifier>CODEN: JMMMDC</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>AFM ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric behavior ; Dielectric properties of solids and liquids ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Exact sciences and technology ; Magnetic behavior ; Magnetic properties and materials ; Magnetic properties of nanostructures ; Nanocrystalline films ; Nickel–zinc ferrite ; Permittivity (dielectric function) ; Physics ; Spin-deposition</subject><ispartof>Journal of magnetism and magnetic materials, 2007, Vol.308 (1), p.137-142</ispartof><rights>2006 Elsevier B.V.</rights><rights>2006 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c427t-8c97da5bbc77fa70cde4bb177911fc06fd96a74a327c3369d6ec596d7308c89c3</citedby><cites>FETCH-LOGICAL-c427t-8c97da5bbc77fa70cde4bb177911fc06fd96a74a327c3369d6ec596d7308c89c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jmmm.2006.05.015$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,782,786,3552,4026,27930,27931,27932,46002</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18207052$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Gupta, Nutan</creatorcontrib><creatorcontrib>Verma, A.</creatorcontrib><creatorcontrib>Kashyap, Subhash C.</creatorcontrib><creatorcontrib>Dube, D.C.</creatorcontrib><title>Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications</title><title>Journal of magnetism and magnetic materials</title><description>Nanocrystalline nickel ferrite and zinc doped nickel ferrite thin films with general composition Ni
1−
x
Zn
x
Fe
2O
4;
x=0.0, 0.2 and 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This method resulted in single phase, transparent, homogeneous and crack-free nanocrystalline ferrite thin films at annealing temperature as low as 400
°C. The substrates used for film deposition were ITO-coated 7059 glass, fused quartz and Si (1
0
0). The thickness of films was found to be in the range ∼1000–5500
Å. The surface microstructure and morphology investigated by atomic force microscopy (AFM) confirmed the grain size of nickel–zinc ferrite films to be in nanometer range indicating nanocrystalline nature of the films. Dielectric properties such as the real (∈′) and imaginary parts (∈″) of complex permittivity were measured in the X-band microwave frequency region (8–12
GHz) by employing extended cavity perturbation technique. The
M–
H hysteresis measurements on the films annealed at 650
°C revealed narrow hysteresis curves with
H
c and
M
s varying for different compositions.</description><subject>AFM</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric behavior</subject><subject>Dielectric properties of solids and liquids</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Exact sciences and technology</subject><subject>Magnetic behavior</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of nanostructures</subject><subject>Nanocrystalline films</subject><subject>Nickel–zinc ferrite</subject><subject>Permittivity (dielectric function)</subject><subject>Physics</subject><subject>Spin-deposition</subject><issn>0304-8853</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp9kbuO1TAQhlOAxLLwAlRuoCLBuTqRaNCKm7SIBmprMh6zc3CcYPsctFS8AQVvyJPg6KxERzUa6Zt_NN8UxZNaVrWshxeH6rAsS9VIOVSyr2Td3ysuZCu7chz79kHxMMaDlLLuxuGi-PWBMawxhSOmYwD3XBgmR5gCowBvxAJfPKXczHQDJ16DWK2IG_vS0LZGTmSEB79iuI0JnGNPwjN-Jffn5-8f7FFYCiFjIt2wF5bdEoXNMcu--DucSMC2OUZIvPr4qLhvwUV6fFcvi89vXn-6eldef3z7_urVdYldo1I54qQM9POMSllQEg1181wrNdW1RTlYMw2gOmgbhW07TGYg7KfBqFaOOE7YXhbPzrlbWL8dKSa9cERyDjytx6ibqW-aXg0ZbM7grikGsnoLvEC41bXUu2990LtvvfvWstfZdx56epcOEcHZAB45_pscG6lk32Tu5ZmjfOqJKeiITB7JcMg_0Gbl_635Cz6Enl4</recordid><startdate>2007</startdate><enddate>2007</enddate><creator>Gupta, Nutan</creator><creator>Verma, A.</creator><creator>Kashyap, Subhash C.</creator><creator>Dube, D.C.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2007</creationdate><title>Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications</title><author>Gupta, Nutan ; Verma, A. ; Kashyap, Subhash C. ; Dube, D.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c427t-8c97da5bbc77fa70cde4bb177911fc06fd96a74a327c3369d6ec596d7308c89c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>AFM</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric behavior</topic><topic>Dielectric properties of solids and liquids</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Exact sciences and technology</topic><topic>Magnetic behavior</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of nanostructures</topic><topic>Nanocrystalline films</topic><topic>Nickel–zinc ferrite</topic><topic>Permittivity (dielectric function)</topic><topic>Physics</topic><topic>Spin-deposition</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gupta, Nutan</creatorcontrib><creatorcontrib>Verma, A.</creatorcontrib><creatorcontrib>Kashyap, Subhash C.</creatorcontrib><creatorcontrib>Dube, D.C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gupta, Nutan</au><au>Verma, A.</au><au>Kashyap, Subhash C.</au><au>Dube, D.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2007</date><risdate>2007</risdate><volume>308</volume><issue>1</issue><spage>137</spage><epage>142</epage><pages>137-142</pages><issn>0304-8853</issn><coden>JMMMDC</coden><abstract>Nanocrystalline nickel ferrite and zinc doped nickel ferrite thin films with general composition Ni
1−
x
Zn
x
Fe
2O
4;
x=0.0, 0.2 and 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This method resulted in single phase, transparent, homogeneous and crack-free nanocrystalline ferrite thin films at annealing temperature as low as 400
°C. The substrates used for film deposition were ITO-coated 7059 glass, fused quartz and Si (1
0
0). The thickness of films was found to be in the range ∼1000–5500
Å. The surface microstructure and morphology investigated by atomic force microscopy (AFM) confirmed the grain size of nickel–zinc ferrite films to be in nanometer range indicating nanocrystalline nature of the films. Dielectric properties such as the real (∈′) and imaginary parts (∈″) of complex permittivity were measured in the X-band microwave frequency region (8–12
GHz) by employing extended cavity perturbation technique. The
M–
H hysteresis measurements on the films annealed at 650
°C revealed narrow hysteresis curves with
H
c and
M
s varying for different compositions.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jmmm.2006.05.015</doi><tpages>6</tpages></addata></record> |
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source | Access via ScienceDirect (Elsevier) |
subjects | AFM Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric behavior Dielectric properties of solids and liquids Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Magnetic behavior Magnetic properties and materials Magnetic properties of nanostructures Nanocrystalline films Nickel–zinc ferrite Permittivity (dielectric function) Physics Spin-deposition |
title | Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications |
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