Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement
Piezoelectric actuators that are used in atomic force microscopes (AFM) have undesirable properties. The nonlinear and hysteretic characteristics of piezoelectric actuators introduce geometric deformations in the reconstructed AFM images. Due to these deformations, the quantitative interpretation of...
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Veröffentlicht in: | Sensors and actuators. A. Physical. 2006-01, Vol.125 (2), p.590-596 |
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creator | Huang, Qiangxian Gonda, Satoshi Misumi, Ichiko Sato, Osamu Keem, Taeho Kurosawa, Tomizo |
description | Piezoelectric actuators that are used in atomic force microscopes (AFM) have undesirable properties. The nonlinear and hysteretic characteristics of piezoelectric actuators introduce geometric deformations in the reconstructed AFM images. Due to these deformations, the quantitative interpretation of the absolute dimensions of surface features is difficult and often not accurate.
A real-time measuring ‘Nano-metrological Atomic Force Microscope’ system equipped with an ultra-high resolution three-axis laser interferometer system is developed, in which the undesirable properties of piezoelectric actuators are compensated completely. Using this AFM and a one-dimensional (1D) grating reference standard with pitches of 240
nm, which is one of the widely used reference standards as nano-metrological lateral scales, the influences of nonlinear and hysteretic characteristics of piezoelectric actuators on image reconstruction and lateral dimension measurement are examined and compared quantitatively among three different measurement methods. The three measurement methods are: (1) the relative movement between probe tip and sample is controlled and measured directly by voltage signals applied on the XYZ scanner, the nonlinear and hysteretic characteristics of piezoelectric actuators are not compensated; (2) the relative movement between probe tip and sample is controlled by voltage signals applied on the XYZ scanner, but it is measured accurately by interferometers; (3) the relative movement between probe tip and sample in lateral directions are both controlled and measured accurately by interferometers. According to the comparison results, an accurate displacement control system is key to reduce the influences of undesirable properties of piezoelectric actuators and the developed AFM system with three-axis laser interferometer system is proved to eliminate the nonlinear and hysteretic characteristics of piezoelectric actuators completely. |
doi_str_mv | 10.1016/j.sna.2005.08.034 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29417085</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0924424705004577</els_id><sourcerecordid>29417085</sourcerecordid><originalsourceid>FETCH-LOGICAL-c328t-3e892a6e5b2c039add08a434d56acba4ba06315ccac6b2aaee7bc5b016c992a13</originalsourceid><addsrcrecordid>eNp9kE1PwzAMhiMEEmPwA7jlxK3FafopTtPElzTgAufITV2RqU1G0iKNX0-mceZk2X4fS34YuxaQChDl7TYNFtMMoEihTkHmJ2wh6komEsrmlC2gyfIkz_LqnF2EsAUAKatqwfpXZwdjCT1H2_HPfZjI02Q0N7YfZrKauOv5ztCPo4H05OMK9TTj5HyIIb56eAncWT5gJHHgnRnJBhMnI2GYPcV2umRnPQ6Brv7qkn083L-vn5LN2-PzerVJtMzqKZFUNxmWVLSZBtlg10GNucy7okTdYt4ilFIUWqMu2wyRqGp10UYBuomgkEt2c7y78-5rpjCp0QRNw4CW3BxU1uSigrqIQXEMau9C8NSrnTcj-r0SoA5G1VZFo-pgVEGtotHI3B0Zih98G_IqaHMw1BkfzajOmX_oX8uWgWY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29417085</pqid></control><display><type>article</type><title>Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Huang, Qiangxian ; Gonda, Satoshi ; Misumi, Ichiko ; Sato, Osamu ; Keem, Taeho ; Kurosawa, Tomizo</creator><creatorcontrib>Huang, Qiangxian ; Gonda, Satoshi ; Misumi, Ichiko ; Sato, Osamu ; Keem, Taeho ; Kurosawa, Tomizo</creatorcontrib><description>Piezoelectric actuators that are used in atomic force microscopes (AFM) have undesirable properties. The nonlinear and hysteretic characteristics of piezoelectric actuators introduce geometric deformations in the reconstructed AFM images. Due to these deformations, the quantitative interpretation of the absolute dimensions of surface features is difficult and often not accurate.
A real-time measuring ‘Nano-metrological Atomic Force Microscope’ system equipped with an ultra-high resolution three-axis laser interferometer system is developed, in which the undesirable properties of piezoelectric actuators are compensated completely. Using this AFM and a one-dimensional (1D) grating reference standard with pitches of 240
nm, which is one of the widely used reference standards as nano-metrological lateral scales, the influences of nonlinear and hysteretic characteristics of piezoelectric actuators on image reconstruction and lateral dimension measurement are examined and compared quantitatively among three different measurement methods. The three measurement methods are: (1) the relative movement between probe tip and sample is controlled and measured directly by voltage signals applied on the XYZ scanner, the nonlinear and hysteretic characteristics of piezoelectric actuators are not compensated; (2) the relative movement between probe tip and sample is controlled by voltage signals applied on the XYZ scanner, but it is measured accurately by interferometers; (3) the relative movement between probe tip and sample in lateral directions are both controlled and measured accurately by interferometers. According to the comparison results, an accurate displacement control system is key to reduce the influences of undesirable properties of piezoelectric actuators and the developed AFM system with three-axis laser interferometer system is proved to eliminate the nonlinear and hysteretic characteristics of piezoelectric actuators completely.</description><identifier>ISSN: 0924-4247</identifier><identifier>EISSN: 1873-3069</identifier><identifier>DOI: 10.1016/j.sna.2005.08.034</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>1D grating ; AFM ; Hysteretic characteristic ; Lateral dimension ; Nonlinear characteristic ; Piezoelectric actuator ; Reference standard</subject><ispartof>Sensors and actuators. A. Physical., 2006-01, Vol.125 (2), p.590-596</ispartof><rights>2005 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c328t-3e892a6e5b2c039add08a434d56acba4ba06315ccac6b2aaee7bc5b016c992a13</citedby><cites>FETCH-LOGICAL-c328t-3e892a6e5b2c039add08a434d56acba4ba06315ccac6b2aaee7bc5b016c992a13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.sna.2005.08.034$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Huang, Qiangxian</creatorcontrib><creatorcontrib>Gonda, Satoshi</creatorcontrib><creatorcontrib>Misumi, Ichiko</creatorcontrib><creatorcontrib>Sato, Osamu</creatorcontrib><creatorcontrib>Keem, Taeho</creatorcontrib><creatorcontrib>Kurosawa, Tomizo</creatorcontrib><title>Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement</title><title>Sensors and actuators. A. Physical.</title><description>Piezoelectric actuators that are used in atomic force microscopes (AFM) have undesirable properties. The nonlinear and hysteretic characteristics of piezoelectric actuators introduce geometric deformations in the reconstructed AFM images. Due to these deformations, the quantitative interpretation of the absolute dimensions of surface features is difficult and often not accurate.
A real-time measuring ‘Nano-metrological Atomic Force Microscope’ system equipped with an ultra-high resolution three-axis laser interferometer system is developed, in which the undesirable properties of piezoelectric actuators are compensated completely. Using this AFM and a one-dimensional (1D) grating reference standard with pitches of 240
nm, which is one of the widely used reference standards as nano-metrological lateral scales, the influences of nonlinear and hysteretic characteristics of piezoelectric actuators on image reconstruction and lateral dimension measurement are examined and compared quantitatively among three different measurement methods. The three measurement methods are: (1) the relative movement between probe tip and sample is controlled and measured directly by voltage signals applied on the XYZ scanner, the nonlinear and hysteretic characteristics of piezoelectric actuators are not compensated; (2) the relative movement between probe tip and sample is controlled by voltage signals applied on the XYZ scanner, but it is measured accurately by interferometers; (3) the relative movement between probe tip and sample in lateral directions are both controlled and measured accurately by interferometers. According to the comparison results, an accurate displacement control system is key to reduce the influences of undesirable properties of piezoelectric actuators and the developed AFM system with three-axis laser interferometer system is proved to eliminate the nonlinear and hysteretic characteristics of piezoelectric actuators completely.</description><subject>1D grating</subject><subject>AFM</subject><subject>Hysteretic characteristic</subject><subject>Lateral dimension</subject><subject>Nonlinear characteristic</subject><subject>Piezoelectric actuator</subject><subject>Reference standard</subject><issn>0924-4247</issn><issn>1873-3069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNp9kE1PwzAMhiMEEmPwA7jlxK3FafopTtPElzTgAufITV2RqU1G0iKNX0-mceZk2X4fS34YuxaQChDl7TYNFtMMoEihTkHmJ2wh6komEsrmlC2gyfIkz_LqnF2EsAUAKatqwfpXZwdjCT1H2_HPfZjI02Q0N7YfZrKauOv5ztCPo4H05OMK9TTj5HyIIb56eAncWT5gJHHgnRnJBhMnI2GYPcV2umRnPQ6Brv7qkn083L-vn5LN2-PzerVJtMzqKZFUNxmWVLSZBtlg10GNucy7okTdYt4ilFIUWqMu2wyRqGp10UYBuomgkEt2c7y78-5rpjCp0QRNw4CW3BxU1uSigrqIQXEMau9C8NSrnTcj-r0SoA5G1VZFo-pgVEGtotHI3B0Zih98G_IqaHMw1BkfzajOmX_oX8uWgWY</recordid><startdate>20060101</startdate><enddate>20060101</enddate><creator>Huang, Qiangxian</creator><creator>Gonda, Satoshi</creator><creator>Misumi, Ichiko</creator><creator>Sato, Osamu</creator><creator>Keem, Taeho</creator><creator>Kurosawa, Tomizo</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20060101</creationdate><title>Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement</title><author>Huang, Qiangxian ; Gonda, Satoshi ; Misumi, Ichiko ; Sato, Osamu ; Keem, Taeho ; Kurosawa, Tomizo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-3e892a6e5b2c039add08a434d56acba4ba06315ccac6b2aaee7bc5b016c992a13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>1D grating</topic><topic>AFM</topic><topic>Hysteretic characteristic</topic><topic>Lateral dimension</topic><topic>Nonlinear characteristic</topic><topic>Piezoelectric actuator</topic><topic>Reference standard</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, Qiangxian</creatorcontrib><creatorcontrib>Gonda, Satoshi</creatorcontrib><creatorcontrib>Misumi, Ichiko</creatorcontrib><creatorcontrib>Sato, Osamu</creatorcontrib><creatorcontrib>Keem, Taeho</creatorcontrib><creatorcontrib>Kurosawa, Tomizo</creatorcontrib><collection>CrossRef</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Sensors and actuators. A. Physical.</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, Qiangxian</au><au>Gonda, Satoshi</au><au>Misumi, Ichiko</au><au>Sato, Osamu</au><au>Keem, Taeho</au><au>Kurosawa, Tomizo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement</atitle><jtitle>Sensors and actuators. A. Physical.</jtitle><date>2006-01-01</date><risdate>2006</risdate><volume>125</volume><issue>2</issue><spage>590</spage><epage>596</epage><pages>590-596</pages><issn>0924-4247</issn><eissn>1873-3069</eissn><abstract>Piezoelectric actuators that are used in atomic force microscopes (AFM) have undesirable properties. The nonlinear and hysteretic characteristics of piezoelectric actuators introduce geometric deformations in the reconstructed AFM images. Due to these deformations, the quantitative interpretation of the absolute dimensions of surface features is difficult and often not accurate.
A real-time measuring ‘Nano-metrological Atomic Force Microscope’ system equipped with an ultra-high resolution three-axis laser interferometer system is developed, in which the undesirable properties of piezoelectric actuators are compensated completely. Using this AFM and a one-dimensional (1D) grating reference standard with pitches of 240
nm, which is one of the widely used reference standards as nano-metrological lateral scales, the influences of nonlinear and hysteretic characteristics of piezoelectric actuators on image reconstruction and lateral dimension measurement are examined and compared quantitatively among three different measurement methods. The three measurement methods are: (1) the relative movement between probe tip and sample is controlled and measured directly by voltage signals applied on the XYZ scanner, the nonlinear and hysteretic characteristics of piezoelectric actuators are not compensated; (2) the relative movement between probe tip and sample is controlled by voltage signals applied on the XYZ scanner, but it is measured accurately by interferometers; (3) the relative movement between probe tip and sample in lateral directions are both controlled and measured accurately by interferometers. According to the comparison results, an accurate displacement control system is key to reduce the influences of undesirable properties of piezoelectric actuators and the developed AFM system with three-axis laser interferometer system is proved to eliminate the nonlinear and hysteretic characteristics of piezoelectric actuators completely.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.sna.2005.08.034</doi><tpages>7</tpages></addata></record> |
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subjects | 1D grating AFM Hysteretic characteristic Lateral dimension Nonlinear characteristic Piezoelectric actuator Reference standard |
title | Nonlinear and hysteretic influence of piezoelectric actuators in AFMs on lateral dimension measurement |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T15%3A41%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nonlinear%20and%20hysteretic%20influence%20of%20piezoelectric%20actuators%20in%20AFMs%20on%20lateral%20dimension%20measurement&rft.jtitle=Sensors%20and%20actuators.%20A.%20Physical.&rft.au=Huang,%20Qiangxian&rft.date=2006-01-01&rft.volume=125&rft.issue=2&rft.spage=590&rft.epage=596&rft.pages=590-596&rft.issn=0924-4247&rft.eissn=1873-3069&rft_id=info:doi/10.1016/j.sna.2005.08.034&rft_dat=%3Cproquest_cross%3E29417085%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29417085&rft_id=info:pmid/&rft_els_id=S0924424705004577&rfr_iscdi=true |