Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene

The current–voltage characteristics of triethylsilylethynyl anthradithiophene (TES ADT) thin‐film transistors can be improved dramatically by a simple and straightforward solvent‐vapor annealing process after device fabrication. Exposing the transistors to dichloroethane vapor for 2 min induces stru...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Weinheim) 2006-07, Vol.18 (13), p.1721-1726
Hauptverfasser: Dickey, K. C., Anthony, J. E., Loo, Y.-L.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1726
container_issue 13
container_start_page 1721
container_title Advanced materials (Weinheim)
container_volume 18
creator Dickey, K. C.
Anthony, J. E.
Loo, Y.-L.
description The current–voltage characteristics of triethylsilylethynyl anthradithiophene (TES ADT) thin‐film transistors can be improved dramatically by a simple and straightforward solvent‐vapor annealing process after device fabrication. Exposing the transistors to dichloroethane vapor for 2 min induces structural rearrangement and crystallization of TES ADT (see figure and cover). This procedure results in drastic increases in on currents; the saturation mobility increases by two orders of magnitude and the current–voltage hysteresis is largely eliminated.
doi_str_mv 10.1002/adma.200600188
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29361799</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29361799</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4248-c103f332fb8e7f74464959661bc35a31539dd38454f0a83aa20c17518c3c445f3</originalsourceid><addsrcrecordid>eNqFkE2P0zAQhi0EEmXhyjknbi7j-CPxsdqly6L9EhQ4Wq5rNwbHLna6kJ_BPyZR0YobpxlpnueV5kXoNYElAajf6l2vlzWAACBt-wQtCK8JZiD5U7QASTmWgrXP0YtSvgGAFCAW6PdVf8jpwcd9dZf3OnpTbTof8dqHvtpkHYsvQ8rVvc0u5V5HY6uhy-m476pPKTzYOOAv-jARqxitDnNQcvPpOPgU8X1Oxpait8FOcd4O3RiKD2OYtziGSZvi9M4PnU-Hzkb7Ej1zOhT76u88Q5_X7zbn7_H13eXV-eoaG1azFhsC1FFau21rG9cwJpjkUgiyNZRrSjiVux1tGWcOdEu1rsGQhpPWUMMYd_QMvTnlTv__ONoyqN4XY0PQ0aZjUbWkgjRSTuDyBJqcSsnWqUP2vc6jIqDm5tXcvHpsfhLkSfjpgx3_Q6vVxc3qXxef3Kl2--vR1fm7Eg1tuPp6e6mY_EgubtYf1C39AwscmoU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29361799</pqid></control><display><type>article</type><title>Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Dickey, K. C. ; Anthony, J. E. ; Loo, Y.-L.</creator><creatorcontrib>Dickey, K. C. ; Anthony, J. E. ; Loo, Y.-L.</creatorcontrib><description>The current–voltage characteristics of triethylsilylethynyl anthradithiophene (TES ADT) thin‐film transistors can be improved dramatically by a simple and straightforward solvent‐vapor annealing process after device fabrication. Exposing the transistors to dichloroethane vapor for 2 min induces structural rearrangement and crystallization of TES ADT (see figure and cover). This procedure results in drastic increases in on currents; the saturation mobility increases by two orders of magnitude and the current–voltage hysteresis is largely eliminated.</description><identifier>ISSN: 0935-9648</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.200600188</identifier><language>eng</language><publisher>Weinheim: WILEY-VCH Verlag</publisher><subject>Electronics ; organic ; Semiconductors ; Semiconductors, organic ; Transistors</subject><ispartof>Advanced materials (Weinheim), 2006-07, Vol.18 (13), p.1721-1726</ispartof><rights>Copyright © 2006 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4248-c103f332fb8e7f74464959661bc35a31539dd38454f0a83aa20c17518c3c445f3</citedby><cites>FETCH-LOGICAL-c4248-c103f332fb8e7f74464959661bc35a31539dd38454f0a83aa20c17518c3c445f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadma.200600188$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45551</link.rule.ids></links><search><creatorcontrib>Dickey, K. C.</creatorcontrib><creatorcontrib>Anthony, J. E.</creatorcontrib><creatorcontrib>Loo, Y.-L.</creatorcontrib><title>Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene</title><title>Advanced materials (Weinheim)</title><addtitle>Adv. Mater</addtitle><description>The current–voltage characteristics of triethylsilylethynyl anthradithiophene (TES ADT) thin‐film transistors can be improved dramatically by a simple and straightforward solvent‐vapor annealing process after device fabrication. Exposing the transistors to dichloroethane vapor for 2 min induces structural rearrangement and crystallization of TES ADT (see figure and cover). This procedure results in drastic increases in on currents; the saturation mobility increases by two orders of magnitude and the current–voltage hysteresis is largely eliminated.</description><subject>Electronics</subject><subject>organic</subject><subject>Semiconductors</subject><subject>Semiconductors, organic</subject><subject>Transistors</subject><issn>0935-9648</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFkE2P0zAQhi0EEmXhyjknbi7j-CPxsdqly6L9EhQ4Wq5rNwbHLna6kJ_BPyZR0YobpxlpnueV5kXoNYElAajf6l2vlzWAACBt-wQtCK8JZiD5U7QASTmWgrXP0YtSvgGAFCAW6PdVf8jpwcd9dZf3OnpTbTof8dqHvtpkHYsvQ8rVvc0u5V5HY6uhy-m476pPKTzYOOAv-jARqxitDnNQcvPpOPgU8X1Oxpait8FOcd4O3RiKD2OYtziGSZvi9M4PnU-Hzkb7Ej1zOhT76u88Q5_X7zbn7_H13eXV-eoaG1azFhsC1FFau21rG9cwJpjkUgiyNZRrSjiVux1tGWcOdEu1rsGQhpPWUMMYd_QMvTnlTv__ONoyqN4XY0PQ0aZjUbWkgjRSTuDyBJqcSsnWqUP2vc6jIqDm5tXcvHpsfhLkSfjpgx3_Q6vVxc3qXxef3Kl2--vR1fm7Eg1tuPp6e6mY_EgubtYf1C39AwscmoU</recordid><startdate>20060704</startdate><enddate>20060704</enddate><creator>Dickey, K. C.</creator><creator>Anthony, J. E.</creator><creator>Loo, Y.-L.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20060704</creationdate><title>Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene</title><author>Dickey, K. C. ; Anthony, J. E. ; Loo, Y.-L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4248-c103f332fb8e7f74464959661bc35a31539dd38454f0a83aa20c17518c3c445f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Electronics</topic><topic>organic</topic><topic>Semiconductors</topic><topic>Semiconductors, organic</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dickey, K. C.</creatorcontrib><creatorcontrib>Anthony, J. E.</creatorcontrib><creatorcontrib>Loo, Y.-L.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dickey, K. C.</au><au>Anthony, J. E.</au><au>Loo, Y.-L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv. Mater</addtitle><date>2006-07-04</date><risdate>2006</risdate><volume>18</volume><issue>13</issue><spage>1721</spage><epage>1726</epage><pages>1721-1726</pages><issn>0935-9648</issn><eissn>1521-4095</eissn><abstract>The current–voltage characteristics of triethylsilylethynyl anthradithiophene (TES ADT) thin‐film transistors can be improved dramatically by a simple and straightforward solvent‐vapor annealing process after device fabrication. Exposing the transistors to dichloroethane vapor for 2 min induces structural rearrangement and crystallization of TES ADT (see figure and cover). This procedure results in drastic increases in on currents; the saturation mobility increases by two orders of magnitude and the current–voltage hysteresis is largely eliminated.</abstract><cop>Weinheim</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/adma.200600188</doi><tpages>6</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0935-9648
ispartof Advanced materials (Weinheim), 2006-07, Vol.18 (13), p.1721-1726
issn 0935-9648
1521-4095
language eng
recordid cdi_proquest_miscellaneous_29361799
source Wiley Online Library Journals Frontfile Complete
subjects Electronics
organic
Semiconductors
Semiconductors, organic
Transistors
title Improving Organic Thin-Film Transistor Performance through Solvent-Vapor Annealing of Solution-Processable Triethylsilylethynyl Anthradithiophene
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T09%3A14%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improving%20Organic%20Thin-Film%20Transistor%20Performance%20through%20Solvent-Vapor%20Annealing%20of%20Solution-Processable%20Triethylsilylethynyl%20Anthradithiophene&rft.jtitle=Advanced%20materials%20(Weinheim)&rft.au=Dickey,%20K.%E2%80%89C.&rft.date=2006-07-04&rft.volume=18&rft.issue=13&rft.spage=1721&rft.epage=1726&rft.pages=1721-1726&rft.issn=0935-9648&rft.eissn=1521-4095&rft_id=info:doi/10.1002/adma.200600188&rft_dat=%3Cproquest_cross%3E29361799%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29361799&rft_id=info:pmid/&rfr_iscdi=true