Simulation of drop/impact reliability for electronic devices

The drop test simulation had been adopted by industries for years, it is still a challenging problem to replace the physical test, which requires the drop test simulation to supply reliable results and sufficient information. Another challenging requirement is to detect the failure inside small comp...

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Veröffentlicht in:Finite elements in analysis and design 2005-03, Vol.41 (6), p.667-680
Hauptverfasser: Wang, Y.Y., Lu, C., Li, J., Tan, X.M., Tse, Y.C.
Format: Artikel
Sprache:eng
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