Rietveld-refinement study of aluminium and gallium nitrides

Powder diffraction data for fine AlN and GaN powders were collected at a Bragg–Brentano diffractometer equipped with a Johansson monochromator and a semiconductor strip detector. Rietveld-refinements were performed in order to determine the structural parameters of these wurtzite-type (space group,...

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Veröffentlicht in:	Journal of alloys and compounds 2004-11, Vol.382 (1-2), p.100-106
Hauptverfasser:	Paszkowicz, W., Podsiadło, S., Minikayev, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminium nitride Condensed matter: structure, mechanical and thermal properties Crystal structure and symmetry Exact sciences and technology Gallium nitride Inorganic compounds Lattice parameter Physics Powder diffraction Rietveld method Semiconductors Structure of solids and liquids crystallography Structure of specific crystalline solids Structure refinement X-ray diffraction
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