Electrostatic writing and imaging using a force microscope
A modified force microscope-the electrostatic force microscope (EFM)-has been used to study the charging properties of a polymer surface. A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface. It was found that the amount of c...
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| Veröffentlicht in: | IEEE transactions on industry applications 1992-01, Vol.28 (1), p.256-260 |
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| container_title | IEEE transactions on industry applications |
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| creator | Saurenbach, F. Terris, B.D. |
| description | A modified force microscope-the electrostatic force microscope (EFM)-has been used to study the charging properties of a polymer surface. A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface. It was found that the amount of charge transferred depended on the voltage applied to the tip and, for low voltages, was independent of previous contacts to the surface. The charge transferred was independent of the number of contacts and the contact time. These results are compared with polymer/metal contact electrification data in the literature.< > |
| doi_str_mv | 10.1109/28.120239 |
| format | Article |
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A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface. It was found that the amount of charge transferred depended on the voltage applied to the tip and, for low voltages, was independent of previous contacts to the surface. The charge transferred was independent of the number of contacts and the contact time. These results are compared with polymer/metal contact electrification data in the literature.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/28.120239</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0093-9994 |
| ispartof | IEEE transactions on industry applications, 1992-01, Vol.28 (1), p.256-260 |
| issn | 0093-9994 1939-9367 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29310278 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Charge measurement Electrostatics Exact sciences and technology Microscopy Physical properties Polymer industry, paints, wood Polymers Properties and testing Spatial resolution Surface charging Surface cleaning Surface properties Technology of polymers Tungsten Voltage Writing |
| title | Electrostatic writing and imaging using a force microscope |
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