Modeling and Characterization of Microstrip-to-Coaxial Transitions
A simple circuit model for the transition from a Iossy microstrip to coaxial line has been developed on an experimental basis. The proposed model can be used to predict accurately the insertion loss and insertion phase over a wide frequency range. Since explicit formulas for the model element values...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1981-08, Vol.29 (8), p.799-805 |
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| container_end_page | 805 |
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| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 29 |
| creator | Majewski, M.L. Rose, R.W. Scott, J.R. |
| description | A simple circuit model for the transition from a Iossy microstrip to coaxial line has been developed on an experimental basis. The proposed model can be used to predict accurately the insertion loss and insertion phase over a wide frequency range. Since explicit formulas for the model element values are given, these elements, representing the parasitic of the transitions, can be taken into account very easify when the microstrip is used as a test fixture for measuring the parameters of solid-state devices. The practical use of the model has been examined for several Z/sub 0/=50-omega lines on both Epsilam-10 and 99-percent alumina substrates with standard SMA coaxial connectors. |
| doi_str_mv | 10.1109/TMTT.1981.1130450 |
| format | Article |
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The practical use of the model has been examined for several Z/sub 0/=50-omega lines on both Epsilam-10 and 99-percent alumina substrates with standard SMA coaxial connectors.</description><subject>Coaxial components</subject><subject>Connectors</subject><subject>Fixtures</subject><subject>Frequency</subject><subject>Insertion loss</subject><subject>Microstrip</subject><subject>Predictive models</subject><subject>Solid modeling</subject><subject>Solid state circuits</subject><subject>Testing</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1981</creationdate><recordtype>article</recordtype><recordid>eNqNkDtPwzAUhS0EEqXwAxBLJjYXP-LXCBEFpFYs2S2T3IBRGhc7lYBfj6NWYoTp6uh-5wwfQpeULCgl5qZe1_WCGk1z5KQU5AjNqBAKG6nIMZoRQjU2pSan6Cyl9xwzo2fobh1a6P3wWrihLao3F10zQvTfbvRhKEJXrH0TQxqj3-Ix4Cq4T-_6oo5uSH5i0jk66Vyf4OJw56he3tfVI149PzxVtyvclIyN2HBhOs4JvHREK22oY8BFJ4wWSnLRlkRAQylTstQgOFGiEVq2jhgugWs-R9f72W0MHztIo9341EDfuwHCLllmWJ5V9G9QK5PVyH-AXJdGsgzSPTiZSBE6u41-4-KXpcRO-u2k30767UF_7lztOx4AfvnD9weXgX9c</recordid><startdate>19810801</startdate><enddate>19810801</enddate><creator>Majewski, M.L.</creator><creator>Rose, R.W.</creator><creator>Scott, J.R.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7QQ</scope><scope>JG9</scope><scope>7QF</scope></search><sort><creationdate>19810801</creationdate><title>Modeling and Characterization of Microstrip-to-Coaxial Transitions</title><author>Majewski, M.L. ; Rose, R.W. ; Scott, J.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c422t-9359f330ebf087891a2e35f59857635d405ec1127648e53075c586da0936e383</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1981</creationdate><topic>Coaxial components</topic><topic>Connectors</topic><topic>Fixtures</topic><topic>Frequency</topic><topic>Insertion loss</topic><topic>Microstrip</topic><topic>Predictive models</topic><topic>Solid modeling</topic><topic>Solid state circuits</topic><topic>Testing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Majewski, M.L.</creatorcontrib><creatorcontrib>Rose, R.W.</creatorcontrib><creatorcontrib>Scott, J.R.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Ceramic Abstracts</collection><collection>Materials Research Database</collection><collection>Aluminium Industry Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Majewski, M.L.</au><au>Rose, R.W.</au><au>Scott, J.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling and Characterization of Microstrip-to-Coaxial Transitions</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1981-08-01</date><risdate>1981</risdate><volume>29</volume><issue>8</issue><spage>799</spage><epage>805</epage><pages>799-805</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A simple circuit model for the transition from a Iossy microstrip to coaxial line has been developed on an experimental basis. The proposed model can be used to predict accurately the insertion loss and insertion phase over a wide frequency range. Since explicit formulas for the model element values are given, these elements, representing the parasitic of the transitions, can be taken into account very easify when the microstrip is used as a test fixture for measuring the parameters of solid-state devices. The practical use of the model has been examined for several Z/sub 0/=50-omega lines on both Epsilam-10 and 99-percent alumina substrates with standard SMA coaxial connectors.</abstract><pub>IEEE</pub><doi>10.1109/TMTT.1981.1130450</doi><tpages>7</tpages></addata></record> |
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| ispartof | IEEE transactions on microwave theory and techniques, 1981-08, Vol.29 (8), p.799-805 |
| issn | 0018-9480 1557-9670 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29287871 |
| source | IEEE Electronic Library (IEL) |
| subjects | Coaxial components Connectors Fixtures Frequency Insertion loss Microstrip Predictive models Solid modeling Solid state circuits Testing |
| title | Modeling and Characterization of Microstrip-to-Coaxial Transitions |
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