Fracture characterization in patterned thin films by cross-sectional nanoindentation
A testing technique based on cross-sectional nanoindentation has been used to assess the mechanical reliability of interconnect structures. A Berkovich indenter was used to initiate fracture in a silicon substrate and cracks propagated through the structure. To better control crack growth and to con...
Gespeichert in:
Veröffentlicht in: | Acta materialia 2006-08, Vol.54 (13), p.3453-3462 |
---|---|
Hauptverfasser: | , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 3462 |
---|---|
container_issue | 13 |
container_start_page | 3453 |
container_title | Acta materialia |
container_volume | 54 |
creator | Ocaña, I. Molina-Aldareguia, J.M. Gonzalez, D. Elizalde, M.R. Sánchez, J.M. Martínez-Esnaola, J.M. Gil Sevillano, J. Scherban, T. Pantuso, D. Sun, B. Xu, G. Miner, B. He, J. Maiz, J. |
description | A testing technique based on cross-sectional nanoindentation has been used to assess the mechanical reliability of interconnect structures. A Berkovich indenter was used to initiate fracture in a silicon substrate and cracks propagated through the structure. To better control crack growth and to convert the problem into two dimensions, a trench parallel to the indentation surface was previously machined using a focused ion beam. The crack lengths obtained for different material systems in the interconnect structure correlate well with the fracture energies measured for the same materials in blanket films. Finite element model simulations incorporating cohesive elements have been used to model the fracture processes and to explain the different cracking behaviour observed. |
doi_str_mv | 10.1016/j.actamat.2006.03.027 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29251353</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1359645406002370</els_id><sourcerecordid>29251353</sourcerecordid><originalsourceid>FETCH-LOGICAL-c403t-ab105b673466e43414c5bcca500b9fd98ffe338ab10e1e58f7cd0f42ee6935973</originalsourceid><addsrcrecordid>eNqFkE1LxDAQhosoqKs_QehF8dI6-Wrak4i4Kix40XNI0wlm6aZr0hXWX2_qLnjTUybD884wT5ZdECgJkOpmWWoz6pUeSwpQlcBKoPIgOyG1ZAXlgh2mmommqLjgx9lpjEsAQiWHk-x1HlJ4EzA373oqMbgvPbrB587naz2mhscuH9_T17p-FfN2m5swxFhENBOo-9xrPzjfoR9_omfZkdV9xPP9O8ve5g-v90_F4uXx-f5uURgObCx0S0C0lWS8qpAzTrgRrTFaALSN7ZraWmSsnjAkKGorTQeWU8SqSedINsuudnPXYfjYYBzVykWDfa89DpuoaENFOpwl8PpPkEBNSV03jCdU7NCfGwNatQ5upcM2QWrSrZZqr1tNuhUwlXSn3OV-hY5G9zZob1z8DctGSqDT_Nsdh0nMp8OgonHoDXYuJJ-qG9w_m74BmxaZmw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1082188934</pqid></control><display><type>article</type><title>Fracture characterization in patterned thin films by cross-sectional nanoindentation</title><source>Elsevier ScienceDirect Journals</source><creator>Ocaña, I. ; Molina-Aldareguia, J.M. ; Gonzalez, D. ; Elizalde, M.R. ; Sánchez, J.M. ; Martínez-Esnaola, J.M. ; Gil Sevillano, J. ; Scherban, T. ; Pantuso, D. ; Sun, B. ; Xu, G. ; Miner, B. ; He, J. ; Maiz, J.</creator><creatorcontrib>Ocaña, I. ; Molina-Aldareguia, J.M. ; Gonzalez, D. ; Elizalde, M.R. ; Sánchez, J.M. ; Martínez-Esnaola, J.M. ; Gil Sevillano, J. ; Scherban, T. ; Pantuso, D. ; Sun, B. ; Xu, G. ; Miner, B. ; He, J. ; Maiz, J.</creatorcontrib><description>A testing technique based on cross-sectional nanoindentation has been used to assess the mechanical reliability of interconnect structures. A Berkovich indenter was used to initiate fracture in a silicon substrate and cracks propagated through the structure. To better control crack growth and to convert the problem into two dimensions, a trench parallel to the indentation surface was previously machined using a focused ion beam. The crack lengths obtained for different material systems in the interconnect structure correlate well with the fracture energies measured for the same materials in blanket films. Finite element model simulations incorporating cohesive elements have been used to model the fracture processes and to explain the different cracking behaviour observed.</description><identifier>ISSN: 1359-6454</identifier><identifier>EISSN: 1873-2453</identifier><identifier>DOI: 10.1016/j.actamat.2006.03.027</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Cohesive model ; Computer simulation ; Crack initiation ; Crack propagation ; Cross sections ; Exact sciences and technology ; Fracture ; Fracture mechanics ; Fractures ; Indenters ; Interfaces ; Mathematical models ; Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology ; Metals. Metallurgy ; Nanoindentation ; Thin films</subject><ispartof>Acta materialia, 2006-08, Vol.54 (13), p.3453-3462</ispartof><rights>2006 Acta Materialia Inc.</rights><rights>2007 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c403t-ab105b673466e43414c5bcca500b9fd98ffe338ab10e1e58f7cd0f42ee6935973</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S1359645406002370$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,3537,23909,23910,25118,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17977024$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ocaña, I.</creatorcontrib><creatorcontrib>Molina-Aldareguia, J.M.</creatorcontrib><creatorcontrib>Gonzalez, D.</creatorcontrib><creatorcontrib>Elizalde, M.R.</creatorcontrib><creatorcontrib>Sánchez, J.M.</creatorcontrib><creatorcontrib>Martínez-Esnaola, J.M.</creatorcontrib><creatorcontrib>Gil Sevillano, J.</creatorcontrib><creatorcontrib>Scherban, T.</creatorcontrib><creatorcontrib>Pantuso, D.</creatorcontrib><creatorcontrib>Sun, B.</creatorcontrib><creatorcontrib>Xu, G.</creatorcontrib><creatorcontrib>Miner, B.</creatorcontrib><creatorcontrib>He, J.</creatorcontrib><creatorcontrib>Maiz, J.</creatorcontrib><title>Fracture characterization in patterned thin films by cross-sectional nanoindentation</title><title>Acta materialia</title><description>A testing technique based on cross-sectional nanoindentation has been used to assess the mechanical reliability of interconnect structures. A Berkovich indenter was used to initiate fracture in a silicon substrate and cracks propagated through the structure. To better control crack growth and to convert the problem into two dimensions, a trench parallel to the indentation surface was previously machined using a focused ion beam. The crack lengths obtained for different material systems in the interconnect structure correlate well with the fracture energies measured for the same materials in blanket films. Finite element model simulations incorporating cohesive elements have been used to model the fracture processes and to explain the different cracking behaviour observed.</description><subject>Applied sciences</subject><subject>Cohesive model</subject><subject>Computer simulation</subject><subject>Crack initiation</subject><subject>Crack propagation</subject><subject>Cross sections</subject><subject>Exact sciences and technology</subject><subject>Fracture</subject><subject>Fracture mechanics</subject><subject>Fractures</subject><subject>Indenters</subject><subject>Interfaces</subject><subject>Mathematical models</subject><subject>Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology</subject><subject>Metals. Metallurgy</subject><subject>Nanoindentation</subject><subject>Thin films</subject><issn>1359-6454</issn><issn>1873-2453</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LxDAQhosoqKs_QehF8dI6-Wrak4i4Kix40XNI0wlm6aZr0hXWX2_qLnjTUybD884wT5ZdECgJkOpmWWoz6pUeSwpQlcBKoPIgOyG1ZAXlgh2mmommqLjgx9lpjEsAQiWHk-x1HlJ4EzA373oqMbgvPbrB587naz2mhscuH9_T17p-FfN2m5swxFhENBOo-9xrPzjfoR9_omfZkdV9xPP9O8ve5g-v90_F4uXx-f5uURgObCx0S0C0lWS8qpAzTrgRrTFaALSN7ZraWmSsnjAkKGorTQeWU8SqSedINsuudnPXYfjYYBzVykWDfa89DpuoaENFOpwl8PpPkEBNSV03jCdU7NCfGwNatQ5upcM2QWrSrZZqr1tNuhUwlXSn3OV-hY5G9zZob1z8DctGSqDT_Nsdh0nMp8OgonHoDXYuJJ-qG9w_m74BmxaZmw</recordid><startdate>20060801</startdate><enddate>20060801</enddate><creator>Ocaña, I.</creator><creator>Molina-Aldareguia, J.M.</creator><creator>Gonzalez, D.</creator><creator>Elizalde, M.R.</creator><creator>Sánchez, J.M.</creator><creator>Martínez-Esnaola, J.M.</creator><creator>Gil Sevillano, J.</creator><creator>Scherban, T.</creator><creator>Pantuso, D.</creator><creator>Sun, B.</creator><creator>Xu, G.</creator><creator>Miner, B.</creator><creator>He, J.</creator><creator>Maiz, J.</creator><general>Elsevier Ltd</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20060801</creationdate><title>Fracture characterization in patterned thin films by cross-sectional nanoindentation</title><author>Ocaña, I. ; Molina-Aldareguia, J.M. ; Gonzalez, D. ; Elizalde, M.R. ; Sánchez, J.M. ; Martínez-Esnaola, J.M. ; Gil Sevillano, J. ; Scherban, T. ; Pantuso, D. ; Sun, B. ; Xu, G. ; Miner, B. ; He, J. ; Maiz, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c403t-ab105b673466e43414c5bcca500b9fd98ffe338ab10e1e58f7cd0f42ee6935973</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Cohesive model</topic><topic>Computer simulation</topic><topic>Crack initiation</topic><topic>Crack propagation</topic><topic>Cross sections</topic><topic>Exact sciences and technology</topic><topic>Fracture</topic><topic>Fracture mechanics</topic><topic>Fractures</topic><topic>Indenters</topic><topic>Interfaces</topic><topic>Mathematical models</topic><topic>Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology</topic><topic>Metals. Metallurgy</topic><topic>Nanoindentation</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ocaña, I.</creatorcontrib><creatorcontrib>Molina-Aldareguia, J.M.</creatorcontrib><creatorcontrib>Gonzalez, D.</creatorcontrib><creatorcontrib>Elizalde, M.R.</creatorcontrib><creatorcontrib>Sánchez, J.M.</creatorcontrib><creatorcontrib>Martínez-Esnaola, J.M.</creatorcontrib><creatorcontrib>Gil Sevillano, J.</creatorcontrib><creatorcontrib>Scherban, T.</creatorcontrib><creatorcontrib>Pantuso, D.</creatorcontrib><creatorcontrib>Sun, B.</creatorcontrib><creatorcontrib>Xu, G.</creatorcontrib><creatorcontrib>Miner, B.</creatorcontrib><creatorcontrib>He, J.</creatorcontrib><creatorcontrib>Maiz, J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Acta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ocaña, I.</au><au>Molina-Aldareguia, J.M.</au><au>Gonzalez, D.</au><au>Elizalde, M.R.</au><au>Sánchez, J.M.</au><au>Martínez-Esnaola, J.M.</au><au>Gil Sevillano, J.</au><au>Scherban, T.</au><au>Pantuso, D.</au><au>Sun, B.</au><au>Xu, G.</au><au>Miner, B.</au><au>He, J.</au><au>Maiz, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fracture characterization in patterned thin films by cross-sectional nanoindentation</atitle><jtitle>Acta materialia</jtitle><date>2006-08-01</date><risdate>2006</risdate><volume>54</volume><issue>13</issue><spage>3453</spage><epage>3462</epage><pages>3453-3462</pages><issn>1359-6454</issn><eissn>1873-2453</eissn><abstract>A testing technique based on cross-sectional nanoindentation has been used to assess the mechanical reliability of interconnect structures. A Berkovich indenter was used to initiate fracture in a silicon substrate and cracks propagated through the structure. To better control crack growth and to convert the problem into two dimensions, a trench parallel to the indentation surface was previously machined using a focused ion beam. The crack lengths obtained for different material systems in the interconnect structure correlate well with the fracture energies measured for the same materials in blanket films. Finite element model simulations incorporating cohesive elements have been used to model the fracture processes and to explain the different cracking behaviour observed.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.actamat.2006.03.027</doi><tpages>10</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1359-6454 |
ispartof | Acta materialia, 2006-08, Vol.54 (13), p.3453-3462 |
issn | 1359-6454 1873-2453 |
language | eng |
recordid | cdi_proquest_miscellaneous_29251353 |
source | Elsevier ScienceDirect Journals |
subjects | Applied sciences Cohesive model Computer simulation Crack initiation Crack propagation Cross sections Exact sciences and technology Fracture Fracture mechanics Fractures Indenters Interfaces Mathematical models Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology Metals. Metallurgy Nanoindentation Thin films |
title | Fracture characterization in patterned thin films by cross-sectional nanoindentation |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T06%3A45%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fracture%20characterization%20in%20patterned%20thin%20films%20by%20cross-sectional%20nanoindentation&rft.jtitle=Acta%20materialia&rft.au=Oca%C3%B1a,%20I.&rft.date=2006-08-01&rft.volume=54&rft.issue=13&rft.spage=3453&rft.epage=3462&rft.pages=3453-3462&rft.issn=1359-6454&rft.eissn=1873-2453&rft_id=info:doi/10.1016/j.actamat.2006.03.027&rft_dat=%3Cproquest_cross%3E29251353%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1082188934&rft_id=info:pmid/&rft_els_id=S1359645406002370&rfr_iscdi=true |