Calculation of film thickness for dip coated antireflective films

Antireflective films require an accurate film thickness to be able to perform optimally. The ideal thickness on most films is a quarter wavelength optical thickness (QWOT). The physical thickness of the QWOT film depends on the refractive index of the material that is being used. Each layer of the a...

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Veröffentlicht in:	Thin solid films 2006-11, Vol.515 (3), p.907-910
Hauptverfasser:	Crawford, L.J., Edmonds, N.R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cross-disciplinary physics: materials science rheology Exact sciences and technology Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Materials science Methods of deposition of films and coatings film growth and epitaxy Physics
Online-Zugang:	Volltext
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