Mechanical characterization and stress engineering of nanocrystalline diamonds films for MEMS applications

In this work we discuss growth and properties of nanocrystalline diamond films grown with a HFCVD system on 4 in. silicon (100) wafers. Nucleation was performed by an in situ bias pretreatment with nucleation densities of more than 10(10) cm 2. Growth of nanocrystalline films has been accomplished b...

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Veröffentlicht in:Diamond and related materials 2005-03, Vol.14 (3-7), p.411-415
Hauptverfasser: HEMANDEZ GUILLEN, F. J, JANISCHOWSKY, Klemens, KUSTERER, Joachim, EBERT, Wolfgang, KOHN, Erhard
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Sprache:eng
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