IDDX-based test methods: A survey

Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (IDDQ ) and transient current (IDDT ) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively...

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Veröffentlicht in:	ACM transactions on design automation of electronic systems 2004-04, Vol.9 (2), p.159-198
Hauptverfasser:	Sabade, Sagar S, Walker, Duncan M
Format:	Artikel
Sprache:	eng
Schlagworte:	Measurement Process engineering Semiconductors Studies Test methods Tests
Online-Zugang:	Volltext
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