Si/SiGe epitaxial-base transistors. II. Process integration and analog applications

For pt. I, see ibid., vol. 3, p. 455-68 (1995). This part focuses on process integration concerns, first described in general terms and then detailed through an extensive review of both simple non-self-aligned device structures and more complex self-aligned device structures. The extension of SiGe d...

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Veröffentlicht in:IEEE transactions on electron devices 1995-03, Vol.42 (3), p.469-482
Hauptverfasser: Harame, D.L., Comfort, J.H., Cressler, J.D., Crabbe, E.F., Sun, J.Y.-C., Meyerson, B.S., Tice, T.
Format: Artikel
Sprache:eng
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Zusammenfassung:For pt. I, see ibid., vol. 3, p. 455-68 (1995). This part focuses on process integration concerns, first described in general terms and then detailed through an extensive review of both simple non-self-aligned device structures and more complex self-aligned device structures. The extension of SiGe device technology to high levels of integration is then discussed through a detailed review of a full SiGe HBT BiCMOS process. Finally, analog circuit design is discussed and concluded, with a description of a 12-bit Digital-to-Analog Converter presented to highlight the current status of SiGe technology.
ISSN:0018-9383
1557-9646
DOI:10.1109/16.368043