Defect-Engineered Semiconducting van der Waals Thin Film at Metal–Semiconductor Interface of Field-Effect Transistors

The significance of metal–semiconductor interfaces and their impact on electronic device performance have gained increasing attention, with a particular focus on investigating the contact metal. However, another avenue of exploration involves substituting the contact metal at the metal–semiconductor...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	ACS nano 2024-01, Vol.18 (1), p.1073-1083
Hauptverfasser:	Kim, Jihyun, Rhee, Dongjoon, Jung, Myeongjin, Cheon, Gang Jin, Kim, Kangsan, Kim, Jae Hyung, Park, Ji Yun, Yoon, Jiyong, Lim, Dong Un, Cho, Jeong Ho, Kim, In Soo, Son, Donghee, Jariwala, Deep, Kang, Joohoon
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!