Reliability life-testing and failure-analysis of GaAs monolithic Ku-band driver amplifiers

'Gallium-arsenide monolithic microwave integrated-circuit (MMIC) Ku-band driver amplifiers were life tested under accelerated high temperature, DC and RF conditions until failure. These MMIC are used in various applications such as radar and satellite communication systems. The failure mechanis...

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Veröffentlicht in:	IEEE transactions on reliability 1998-06, Vol.47 (2), p.119-125
Hauptverfasser:	Mittereder, J.A., Roussos, J.A., Christianson, K.A., Anderson, W.T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Driver circuits Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Failure analysis Gallium arsenide Life estimation Life testing Microwave amplifiers Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits MMICs Radio frequency Radiofrequency amplifiers Temperature Testing, measurement, noise and reliability
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