$Identification of Kikuchi lines in electron diffraction patterns collected in small‐angle geometry$

Identification of Kikuchi lines in electron diffraction patterns collected in small‐angle geometry

It is demonstrated that Kikuchi features become clearly visible if reflection high‐energy electron diffraction (RHEED) patterns are filtered using digital image processing software. The results of such pattern transformations are shown for SrTiO3 with mixed surface termination for data collected at...

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Veröffentlicht in:	Acta crystallographica. Section A, Foundations and advances Foundations and advances, 2024-01, Vol.80 (1), p.104-111
Hauptverfasser:	Mitura, Zbigniew, Szwachta, Grzegorz, Kokosza, Łukasz, Przybylski, Marek
Format:	Artikel
Sprache:	eng
Schlagworte:	Coherent scattering Computer graphics Diffraction patterns digital images Digital imaging Electron beams Electron diffraction Image filters Image processing Incoherent scattering Kikuchi lines Kikuchi patterns nanostructured materials perovskites reflection high‐energy electron diffraction RHEED Thin films Vibrations Wave diffraction
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