Oxygen exchange and diffusion measurements: The importance of extracting the correct initial and boundary conditions

18O / 16O exchange followed by Secondary Ion Mass Spectrometry (SIMS) analysis is often used to determine the oxygen tracer diffusion coefficient D* and the oxygen surface exchange coefficient k* of oxide materials. Conventionally, the experiment consists of annealing an equilibrated, semi-infinite...

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Veröffentlicht in:	Solid state ionics 2005-07, Vol.176 (23), p.1915-1920
Hauptverfasser:	De Souza, R.A., Chater, R.J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Isotope exchange Oxygen diffusion SIMS
Online-Zugang:	Volltext
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