API Tests for RAM Chips

With 16K RAM chips already in commercial use and 64K RAM chips being planned, the increasing length of time needed to run test patterns could lead to cost increases that would offset the advantages of the larger devices. For example, many existing tests of the important pattern-sensitive-fault class...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Computer (Long Beach, Calif.) Calif.), 1977-07, Vol.10 (7), p.32-35
1. Verfasser:	Srini, V.P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Fault detection Frequency Geometry Power generation economics Production Sequential analysis Temperature Testing
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!