Characterizing unpoled piezoelectric ceramic film by Lamb-waves
Determination of the physical properties of unpoled ceramic films on metallic substrates is considered; the problem is important because these properties may be quite different than those in the bulk, which are caused by the effects of porosity. It is shown that the density and elastic constant C/su...
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| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 1999-09, Vol.46 (5), p.1094-1100 |
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| container_title | IEEE transactions on ultrasonics, ferroelectrics, and frequency control |
| container_volume | 46 |
| creator | Wang, Z. Cheeke, J.D.N. |
| description | Determination of the physical properties of unpoled ceramic films on metallic substrates is considered; the problem is important because these properties may be quite different than those in the bulk, which are caused by the effects of porosity. It is shown that the density and elastic constant C/sub 33/ can be determined by a modification of the previously used modal frequency spacing (MFS) method, involving cut-off frequencies for longitudinal and shear sagittal plane modes. This method has the advantage of great simplicity compared with the standard inversion approach. Numerical calculations show that good accuracy of the order of 2% can be obtained for density and for C/sub 33/ for simulations of PZT films on stainless steel, platinum, and aluminum plates. |
| doi_str_mv | 10.1109/58.796115 |
| format | Article |
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It is shown that the density and elastic constant C/sub 33/ can be determined by a modification of the previously used modal frequency spacing (MFS) method, involving cut-off frequencies for longitudinal and shear sagittal plane modes. This method has the advantage of great simplicity compared with the standard inversion approach. Numerical calculations show that good accuracy of the order of 2% can be obtained for density and for C/sub 33/ for simulations of PZT films on stainless steel, platinum, and aluminum plates.</description><identifier>ISSN: 0885-3010</identifier><identifier>EISSN: 1525-8955</identifier><identifier>DOI: 10.1109/58.796115</identifier><identifier>PMID: 18244303</identifier><identifier>CODEN: ITUCER</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Acoustic measurements ; Acoustical measurements and instrumentation ; Acoustics ; Aluminum ; Applied sciences ; Building materials. Ceramics. Glasses ; Ceramic industries ; Ceramics ; Chemical industry and chemicals ; Coatings ; Computer simulation ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Cut-off ; Density ; Dielectric constant ; Exact sciences and technology ; Frequency ; Fundamental areas of phenomenology (including applications) ; General studies ; Inversions ; Lead zirconate titanates ; Materials science ; Materials testing ; Mathematical models ; Mechanical and acoustical properties ; Nondestructive testing: ultrasonic testing, photoacoustic testing ; Physical properties of thin films, nonelectronic ; Physics ; Piezoelectric films ; Platinum ; Shear ; Steel ; Substrates ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Technical ceramics ; Thick films</subject><ispartof>IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 1999-09, Vol.46 (5), p.1094-1100</ispartof><rights>1999 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c425t-5499398c3942cc97f064fa1ca8aa806524a0d97193589b64f2ca66df28d305703</citedby><cites>FETCH-LOGICAL-c425t-5499398c3942cc97f064fa1ca8aa806524a0d97193589b64f2ca66df28d305703</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/796115$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/796115$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1958571$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/18244303$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Z.</creatorcontrib><creatorcontrib>Cheeke, J.D.N.</creatorcontrib><title>Characterizing unpoled piezoelectric ceramic film by Lamb-waves</title><title>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</title><addtitle>T-UFFC</addtitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><description>Determination of the physical properties of unpoled ceramic films on metallic substrates is considered; the problem is important because these properties may be quite different than those in the bulk, which are caused by the effects of porosity. It is shown that the density and elastic constant C/sub 33/ can be determined by a modification of the previously used modal frequency spacing (MFS) method, involving cut-off frequencies for longitudinal and shear sagittal plane modes. This method has the advantage of great simplicity compared with the standard inversion approach. Numerical calculations show that good accuracy of the order of 2% can be obtained for density and for C/sub 33/ for simulations of PZT films on stainless steel, platinum, and aluminum plates.</description><subject>Acoustic measurements</subject><subject>Acoustical measurements and instrumentation</subject><subject>Acoustics</subject><subject>Aluminum</subject><subject>Applied sciences</subject><subject>Building materials. Ceramics. Glasses</subject><subject>Ceramic industries</subject><subject>Ceramics</subject><subject>Chemical industry and chemicals</subject><subject>Coatings</subject><subject>Computer simulation</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Cut-off</subject><subject>Density</subject><subject>Dielectric constant</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>General studies</subject><subject>Inversions</subject><subject>Lead zirconate titanates</subject><subject>Materials science</subject><subject>Materials testing</subject><subject>Mathematical models</subject><subject>Mechanical and acoustical properties</subject><subject>Nondestructive testing: ultrasonic testing, photoacoustic testing</subject><subject>Physical properties of thin films, nonelectronic</subject><subject>Physics</subject><subject>Piezoelectric films</subject><subject>Platinum</subject><subject>Shear</subject><subject>Steel</subject><subject>Substrates</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Technical ceramics</subject><subject>Thick films</subject><issn>0885-3010</issn><issn>1525-8955</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0UFvEzEQBWALFdG0cODKAe0BAT1smbE9a_uEUFRKpUhc4LyaeL3FaDeb2klR8-vZKKvmVvU0h_n0ZqQnxFuES0RwX8heGlch0gsxQ5JUWkd0ImZgLZUKEE7FWc5_AVBrJ1-JU7RSawVqJr7O_3Bivwkp7uLqttiu1kMXmmIdw24IXfCbFH3hQ-J-nG3s-mL5UCy4X5b_-D7k1-Jly10Ob6Z5Ln5_v_o1_1Eufl7fzL8tSq8lbUrSzilnvXJaeu9MC5VuGT1bZgsVSc3QOINOkXXLcSc9V1XTStsoIAPqXHw65K7TcLcNeVP3MfvQdbwKwzbXRo13QEo5yo9PSmkNWVD0DCjBocYRfn4SYmVQGatw_-bFgfo05JxCW69T7Dk91Aj1vquabH3oarTvp9jtsg_NUU7ljODDBDh77trEKx_z0TmyZPbvvTuwGEJ43E5H_gOz_aB3</recordid><startdate>19990901</startdate><enddate>19990901</enddate><creator>Wang, Z.</creator><creator>Cheeke, J.D.N.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><scope>7QF</scope><scope>8BQ</scope><scope>7X8</scope></search><sort><creationdate>19990901</creationdate><title>Characterizing unpoled piezoelectric ceramic film by Lamb-waves</title><author>Wang, Z. ; Cheeke, J.D.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c425t-5499398c3942cc97f064fa1ca8aa806524a0d97193589b64f2ca66df28d305703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Acoustic measurements</topic><topic>Acoustical measurements and instrumentation</topic><topic>Acoustics</topic><topic>Aluminum</topic><topic>Applied sciences</topic><topic>Building materials. Ceramics. Glasses</topic><topic>Ceramic industries</topic><topic>Ceramics</topic><topic>Chemical industry and chemicals</topic><topic>Coatings</topic><topic>Computer simulation</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Cut-off</topic><topic>Density</topic><topic>Dielectric constant</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>General studies</topic><topic>Inversions</topic><topic>Lead zirconate titanates</topic><topic>Materials science</topic><topic>Materials testing</topic><topic>Mathematical models</topic><topic>Mechanical and acoustical properties</topic><topic>Nondestructive testing: ultrasonic testing, photoacoustic testing</topic><topic>Physical properties of thin films, nonelectronic</topic><topic>Physics</topic><topic>Piezoelectric films</topic><topic>Platinum</topic><topic>Shear</topic><topic>Steel</topic><topic>Substrates</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Technical ceramics</topic><topic>Thick films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Z.</creatorcontrib><creatorcontrib>Cheeke, J.D.N.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aluminium Industry Abstracts</collection><collection>METADEX</collection><collection>MEDLINE - Academic</collection><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wang, Z.</au><au>Cheeke, J.D.N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterizing unpoled piezoelectric ceramic film by Lamb-waves</atitle><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle><stitle>T-UFFC</stitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><date>1999-09-01</date><risdate>1999</risdate><volume>46</volume><issue>5</issue><spage>1094</spage><epage>1100</epage><pages>1094-1100</pages><issn>0885-3010</issn><eissn>1525-8955</eissn><coden>ITUCER</coden><abstract>Determination of the physical properties of unpoled ceramic films on metallic substrates is considered; the problem is important because these properties may be quite different than those in the bulk, which are caused by the effects of porosity. It is shown that the density and elastic constant C/sub 33/ can be determined by a modification of the previously used modal frequency spacing (MFS) method, involving cut-off frequencies for longitudinal and shear sagittal plane modes. This method has the advantage of great simplicity compared with the standard inversion approach. Numerical calculations show that good accuracy of the order of 2% can be obtained for density and for C/sub 33/ for simulations of PZT films on stainless steel, platinum, and aluminum plates.</abstract><cop>New York, NY</cop><pub>IEEE</pub><pmid>18244303</pmid><doi>10.1109/58.796115</doi><tpages>7</tpages></addata></record> |
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| subjects | Acoustic measurements Acoustical measurements and instrumentation Acoustics Aluminum Applied sciences Building materials. Ceramics. Glasses Ceramic industries Ceramics Chemical industry and chemicals Coatings Computer simulation Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Cut-off Density Dielectric constant Exact sciences and technology Frequency Fundamental areas of phenomenology (including applications) General studies Inversions Lead zirconate titanates Materials science Materials testing Mathematical models Mechanical and acoustical properties Nondestructive testing: ultrasonic testing, photoacoustic testing Physical properties of thin films, nonelectronic Physics Piezoelectric films Platinum Shear Steel Substrates Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Technical ceramics Thick films |
| title | Characterizing unpoled piezoelectric ceramic film by Lamb-waves |
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