Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope
To study the phase transition of copper (II) phthalocyanine (Cu-Pc) thin films, we measured the surface resistance using a near-field scanning microwave microscope (NSMM) by measuring the microwave reflection coefficient S 11. The crystal structure of Cu-Pc thin films transformed from the α -phase o...
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| Veröffentlicht in: | Thin solid films 2006-03, Vol.499 (1), p.318-321 |
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| container_title | Thin solid films |
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| creator | Park, Miehwa Yoo, Hyunjun Yoo, Hyungun Na, Seungwook Kim, Songhui Lee, Kiejin Friedman, Barry Lim, Eunju Iwamoto, Mitsumasa |
| description | To study the phase transition of copper (II) phthalocyanine (Cu-Pc) thin films, we measured the surface resistance using a near-field scanning microwave microscope (NSMM) by measuring the microwave reflection coefficient
S
11. The crystal structure of Cu-Pc thin films transformed from the α
-phase of the orthorhombic crystal to the thermally stable β-phase of the monoclinic crystal as the substrate heating temperatures increased. The surface resistance depended on the crystal structures of the Cu-Pc thin films. As the phase changed from the α
-phase to the β-phase, the surface resistance of the Cu-Pc thin films decreased. |
| doi_str_mv | 10.1016/j.tsf.2005.07.119 |
| format | Article |
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S
11. The crystal structure of Cu-Pc thin films transformed from the α
-phase of the orthorhombic crystal to the thermally stable β-phase of the monoclinic crystal as the substrate heating temperatures increased. The surface resistance depended on the crystal structures of the Cu-Pc thin films. As the phase changed from the α
-phase to the β-phase, the surface resistance of the Cu-Pc thin films decreased.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2005.07.119</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Copper (II) phthalocyanine thin films ; Crystalline state (including molecular motions in solids) ; Crystallographic aspects of phase transformations; pressure effects ; Exact sciences and technology ; Near-field scanning microwave microscope (NSMM) ; Organic compounds ; Phase transition ; Physics ; Structure of solids and liquids; crystallography ; Structure of specific crystalline solids ; Surface resistance</subject><ispartof>Thin solid films, 2006-03, Vol.499 (1), p.318-321</ispartof><rights>2005 Elsevier B.V.</rights><rights>2007 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c402t-5d4f146f1cbef15d4b9411412771d3fd8f360548f20a801d855a25db2c176e803</citedby><cites>FETCH-LOGICAL-c402t-5d4f146f1cbef15d4b9411412771d3fd8f360548f20a801d855a25db2c176e803</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0040609005007662$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,3537,23909,23910,25118,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17599654$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Park, Miehwa</creatorcontrib><creatorcontrib>Yoo, Hyunjun</creatorcontrib><creatorcontrib>Yoo, Hyungun</creatorcontrib><creatorcontrib>Na, Seungwook</creatorcontrib><creatorcontrib>Kim, Songhui</creatorcontrib><creatorcontrib>Lee, Kiejin</creatorcontrib><creatorcontrib>Friedman, Barry</creatorcontrib><creatorcontrib>Lim, Eunju</creatorcontrib><creatorcontrib>Iwamoto, Mitsumasa</creatorcontrib><title>Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope</title><title>Thin solid films</title><description>To study the phase transition of copper (II) phthalocyanine (Cu-Pc) thin films, we measured the surface resistance using a near-field scanning microwave microscope (NSMM) by measuring the microwave reflection coefficient
S
11. The crystal structure of Cu-Pc thin films transformed from the α
-phase of the orthorhombic crystal to the thermally stable β-phase of the monoclinic crystal as the substrate heating temperatures increased. The surface resistance depended on the crystal structures of the Cu-Pc thin films. As the phase changed from the α
-phase to the β-phase, the surface resistance of the Cu-Pc thin films decreased.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Copper (II) phthalocyanine thin films</subject><subject>Crystalline state (including molecular motions in solids)</subject><subject>Crystallographic aspects of phase transformations; pressure effects</subject><subject>Exact sciences and technology</subject><subject>Near-field scanning microwave microscope (NSMM)</subject><subject>Organic compounds</subject><subject>Phase transition</subject><subject>Physics</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Structure of specific crystalline solids</subject><subject>Surface resistance</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNp9kE1v1DAQhi0EEkvhB3DzBUQPCTOOHSfihCo-VqpED-Vsee0x8SqbBDtbtPz6erWVuHGyLT3v65mHsbcINQK2H_f1mkMtAFQNukbsn7ENdrqvhG7wOdsASKha6OEle5XzHgBQiGbDjneDzcTXZKcc1zhPfA7czctCiX_Ybq_5MqyDHWd3slOcCjjEiYc4HjJ3g03WrZTiX_J8d-KWT2RTFSKNnmdnp5L4xQ_RpfmPfaDLLZdyes1eBDtmevN0XrGfX7_c33yvbn982958vq2cBLFWysuAsg3odhSwvHa9RJQotEbfBN-FpgUluyDAdoC-U8oK5XfCoW6pg-aKvb_0Lmn-faS8mkPMjsbRTjQfsxGdlr1QTQHxAp4nzImCWVI82HQyCOYs2OxNEWzOgg1oUwSXzLuncluWHUNR6GL-F9Sq71slC_fpwlHZ9CFSMtlFmhz5mMitxs_xP788AklWkZc</recordid><startdate>20060321</startdate><enddate>20060321</enddate><creator>Park, Miehwa</creator><creator>Yoo, Hyunjun</creator><creator>Yoo, Hyungun</creator><creator>Na, Seungwook</creator><creator>Kim, Songhui</creator><creator>Lee, Kiejin</creator><creator>Friedman, Barry</creator><creator>Lim, Eunju</creator><creator>Iwamoto, Mitsumasa</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20060321</creationdate><title>Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope</title><author>Park, Miehwa ; Yoo, Hyunjun ; Yoo, Hyungun ; Na, Seungwook ; Kim, Songhui ; Lee, Kiejin ; Friedman, Barry ; Lim, Eunju ; Iwamoto, Mitsumasa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c402t-5d4f146f1cbef15d4b9411412771d3fd8f360548f20a801d855a25db2c176e803</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Copper (II) phthalocyanine thin films</topic><topic>Crystalline state (including molecular motions in solids)</topic><topic>Crystallographic aspects of phase transformations; pressure effects</topic><topic>Exact sciences and technology</topic><topic>Near-field scanning microwave microscope (NSMM)</topic><topic>Organic compounds</topic><topic>Phase transition</topic><topic>Physics</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Structure of specific crystalline solids</topic><topic>Surface resistance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Park, Miehwa</creatorcontrib><creatorcontrib>Yoo, Hyunjun</creatorcontrib><creatorcontrib>Yoo, Hyungun</creatorcontrib><creatorcontrib>Na, Seungwook</creatorcontrib><creatorcontrib>Kim, Songhui</creatorcontrib><creatorcontrib>Lee, Kiejin</creatorcontrib><creatorcontrib>Friedman, Barry</creatorcontrib><creatorcontrib>Lim, Eunju</creatorcontrib><creatorcontrib>Iwamoto, Mitsumasa</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Park, Miehwa</au><au>Yoo, Hyunjun</au><au>Yoo, Hyungun</au><au>Na, Seungwook</au><au>Kim, Songhui</au><au>Lee, Kiejin</au><au>Friedman, Barry</au><au>Lim, Eunju</au><au>Iwamoto, Mitsumasa</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope</atitle><jtitle>Thin solid films</jtitle><date>2006-03-21</date><risdate>2006</risdate><volume>499</volume><issue>1</issue><spage>318</spage><epage>321</epage><pages>318-321</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>To study the phase transition of copper (II) phthalocyanine (Cu-Pc) thin films, we measured the surface resistance using a near-field scanning microwave microscope (NSMM) by measuring the microwave reflection coefficient
S
11. The crystal structure of Cu-Pc thin films transformed from the α
-phase of the orthorhombic crystal to the thermally stable β-phase of the monoclinic crystal as the substrate heating temperatures increased. The surface resistance depended on the crystal structures of the Cu-Pc thin films. As the phase changed from the α
-phase to the β-phase, the surface resistance of the Cu-Pc thin films decreased.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2005.07.119</doi><tpages>4</tpages></addata></record> |
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| subjects | Condensed matter: structure, mechanical and thermal properties Copper (II) phthalocyanine thin films Crystalline state (including molecular motions in solids) Crystallographic aspects of phase transformations pressure effects Exact sciences and technology Near-field scanning microwave microscope (NSMM) Organic compounds Phase transition Physics Structure of solids and liquids crystallography Structure of specific crystalline solids Surface resistance |
| title | Phase transition of copper (II) phthalocyanine thin films characterized by a near-field scanning microwave microscope |
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